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Who invented XPS? 

Thin film
Spectrometer
X-ray photoelectron spectroscopy
Nanostructure
Silicon

Answers from top 9 papers

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Papers (9)Insight
Open access•Journal Article•DOI
Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements
Donald R. Baer, Kateryna Artyushkova, C. Richard Brundle, James Castle, Mark H. Engelhard, Karen J. Gaskell, John T. Grant, Richard T. Haasch, Matthew R. Linford, Cedric J. Powell, Alexander G. Shard, Peter M. A. Sherwood, Vincent S. Smentkowski 
08 Apr 2019-Journal of Vacuum Science and Technology
105 Citations
This article is the first in a series of guides assembled by a committee of experienced XPS practitioners that are intended to assist inexperienced users by providing information about good practices in the use of XPS.
Journal Article•DOI
Determination of barrier oxidation states in spin dependent tunneling structures
Manish Sharma, Shan X. Wang, Janice H. Nickel 
13 May 1999-Journal of Applied Physics
13 Citations
XPS is shown to be a powerful tool in characterizing the materials sets that comprise SDT devices.
Journal Article•DOI
Splitting of the XPS in Ferroelectric SbSI Crystals
Jonas Grigas, E. Talik, V. Lazauskas 
01 Jan 2003-Ferroelectrics
29 Citations
This is the first observation of the splitting of the XPS in a ferroelectric crystal.
Journal Article•DOI
Application of angle‐resolved XPS algorithms to overlayers and concentration gradients
Brian J. Tielsch, Julia E. Fulghum 
01 Sep 1994-Surface and Interface Analysis
18 Citations
A comparison of angle-resolved XPS data from different samples thus requires careful and consistent choices for algorithm parameters.
Journal Article•DOI
Improved accuracy of quantitative XPS analysis using predetermined spectrometer transmission functions with UNIFIT 2004
R. Hesse, P. Streubel, R. Szargan 
01 Jul 2005-Surface and Interface Analysis
78 Citations
The accuracy of quantitative XPS analysis can be improved using predetermined transmission functions.
Journal Article•DOI
The equivalent width as a figure of merit for XPS narrow scans
Bhupinder Singh, Daniel Velazquez, Jeff Terry, Matthew R. Linford 
01 Dec 2014-Journal of Electron Spectroscopy and Related Phenomena
12 Citations
EW XPS and PE max appear to correlate with the expected chemistries of all the systems studied.
Journal Article•DOI
An XPS study of Si as it occurs in adsorbents, catalysts, and thin films
Tery L. Barr
01 Apr 1983-Applications of Surface Science
233 Citations
These studies demonstrate the interconnection of XPS techniques and results over fields that often seem totally divorced from one another.
Journal Article•DOI
Imaging XPS—A new technique, I—principles
N. Gurker, Maria F. Ebel, Horst Ebel 
01 Feb 1983-Surface and Interface Analysis
48 Citations
It will be applicable to any kind of specimen that can be analysed in a conventional XPS system.
Journal Article•DOI
High resolution-high energy x-ray photoelectron spectroscopy using third-generation synchrotron radiation source, and its application to Si-high k insulator systems
Keisuke Kobayashi, Makina Yabashi, Yasutaka Takata, Takashi Tokushima, Shik Shin, Kenji Tamasaku, Daigo Miwa, Tetsuya Ishikawa, Hiroshi Nohira, Takeshi Hattori, Y. Sugita, Osamu Nakatsuka, Akira Sakai, Shigeaki Zaima 
30 Jul 2003-Applied Physics Letters
310 Citations
Our results show the wide applicability of high resolution XPS with hard x rays from a synchrotron source.

Related Questions

What is xps?3 answersX-ray photoelectron spectroscopy (XPS) is a technique used for surface characterization and analysis of materials, including polymers and biomedical materials. It provides a quantitative elemental analysis of the top few nanometers of a solid surface. XPS requires five basic components: an x-ray source, a sample holder, a kinetic energy analyzer, an electron detector, and an ultra-high vacuum system. The analyzer separates the photoelectrons emitted by the sample based on their kinetic energy, similar to how a monochromator separates light based on wavelength in a spectrophotometer. XPS can induce changes in the chemical state of elements, which may affect the understanding of their environmental behavior. For example, X-ray irradiation can lead to a negative shift in the U 4f spectra, indicating a break in uranyl molecules or photocatalytic reduction to U(IV) species. XPS is a widely used technique in material surface analysis, but its results can be subject to operator arbitrariness. Core-level XPS is particularly useful for investigating the electronic states of strongly correlated electron systems.
How is XPS used in bitumen research?5 answersXPS is used in bitumen research for surface chemical analysis and characterization of materials. It can be used to identify contamination on a surface, characterize materials for process control, and analyze new materials in a research environment. XPS spectral analysis, imaging, and sputter profiling are applied to various types of samples in industrial laboratories. In the study of adhesion between aggregates and bitumen, XPS was used to characterize the interface between bitumen and minerals, before and after peeling, and detect sulfur residues. XPS analysis of archaeological bitumen was used to determine its provenance and shed light on trade and communication among human populations. XPS is a valuable tool in bitumen research for understanding the composition, properties, and origins of bitumen samples.
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