Topic
Automatic test pattern generation
About: Automatic test pattern generation is a research topic. Over the lifetime, 8214 publications have been published within this topic receiving 140773 citations. The topic is also known as: ATPG.
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18 Oct 1998
TL;DR: This paper describes a structured test re-use methodology and infrastructure for core-based system chips that addresses the test access, isolation, interconnect and shadow logic test problems without requiring modifications to the components, even for cores with more ports than chip pins.
Abstract: This paper describes a structured test re-use methodology and infrastructure for core-based system chips. The methodology is based on the use of a structured test bus framework that provides access to virtual components in a system chip allowing the test methodologies and test vectors for these components to be re-used. It addresses the test access, isolation, interconnect and shadow logic test problems without requiring modifications to the components, even for cores with more ports than chip pins. The test area overhead required, including test bus routing, to implement this methodology can be less than 1%.
298 citations
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TL;DR: This work proposes a new approach for automating the generation of system test scenarios in the context of object-oriented embedded software, taking into account traceability problems between high-level views and concrete test case execution.
Abstract: Use cases are believed to be a good basis for system testing. Yet, to automate the test generation process, there is a large gap to bridge between high-level use cases and concrete test cases. We propose a new approach for automating the generation of system test scenarios in the context of object-oriented embedded software, taking into account traceability problems between high-level views and concrete test case execution. Starting from a formalization of the requirements based on use cases extended with contracts, we automatically build a transition system from which we synthesize test cases. Our objective is to cover the system in terms of statement coverage with those generated tests: an empirical evaluation of our approach is given based on this objective and several case studies. We briefly discuss the experimental deployment of our approach in the field at Thales Airborne Systems.
298 citations
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IBM1
TL;DR: A new analytical method of computing the fault coverage that is fast compared with simulation is described that is possible to identify the ``random-pattern-resistant'' faults, modify the logic to make them easy to detect, and thus, increase the fault Coverage of the random test.
Abstract: A major problem in self testing with random inputs is verification of the test quality, i.e., the computation of the fault coverage. The brute-force approach of using full-fault simulation does not seem attractive because of the logic structure volume, and the CPU time encountered. A new approach is therefore necessary. This paper describes a new analytical method of computing the fault coverage that is fast compared with simulation. If the fault coverage falls below a certain threshold, it is possible to identify the ``random-pattern-resistant'' faults, modify the logic to make them easy to detect, and thus, increase the fault coverage of the random test.
296 citations
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IBM1
TL;DR: It is shown that the broad-side method is inferior to the skewed-load method, which is another form of scan-based transition test, and there is, however, a merit in combining the skewed -load method with the broad -side method to achieve a higher transition fault coverage.
Abstract: A broad-side delay test is a form of a scan-based delay test, where the first vector of the pair is scanned into the chain and the second vector of the pair is the combinational circuit's response to this first vector. This delay test form is called "broad-side" since the second vector of the delay test pair is provided in a broad-side fashion, namely through the logic. This paper concentrates on several issues concerning broad-side delay test. It analyzes the effectiveness of broad-side delay test; shows how to compute broad-side delay test vectors; shows how to generate broad-side delay test vectors using existing tools that were aimed at stuck-at faults; shows how to compute the detection probability of a transition fault using broad-side pseudo-random patterns; shows the results of experiments conducted on the ISCAS sequential benchmarks; and discusses some concerns of the broad-side delay test strategy. It is shown that the broad-side method is inferior to the skewed-load method, which is another form of scan-based transition test. There is, however, a merit in combining the skewed-load method with the broad-side method. This combined method will achieve a higher transition fault coverage than each individual method alone. >
296 citations
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TL;DR: A unified notation is presented for static random access memory (SRAM) fault models and fault tests for these models, and empirical results showing the fault coverage of the different test enable SRAM users to choose the fault models of interest as well as the test.
Abstract: A unified notation is presented for static random access memory (SRAM) fault models and fault tests for these models. The likelihood that the different types of faults will occur is demonstrated using inductive fault analysis and physical defect analysis. A set of march tests is discussed, together with methods to make composite tests for collections of fault tapes. Empirical results showing the fault coverage of the different test enable SRAM users to choose the fault models of interest as well as the test. >
288 citations