Topic
Automatic test pattern generation
About: Automatic test pattern generation is a research topic. Over the lifetime, 8214 publications have been published within this topic receiving 140773 citations. The topic is also known as: ATPG.
Papers published on a yearly basis
Papers
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27 Apr 2003TL;DR: A new method that employs ATE and BIST structures to apply coded test patterns to LSI circuits to show drastic test cost reduction capability of the proposed method is proposed.
Abstract: It is common to use ATPG of scan-based design for high fault coverage in LSI testing. However, significant increase in test cost is caused in accordance with increasing design complexity. Recent strategies for test cost reduction combine ATPG and BIST techniques. Unfortunately, these strategies have serious constraints. We propose a new method that employs ATE and BIST structures to apply coded test patterns to LSI circuits. Results obtained using practical circuits show drastic test cost reduction capability of the proposed method.
67 citations
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TL;DR: The concept of solution sequences to test problems for primitive elements is introduced and a functional language used to describe solution sequences is presented, including procedures for implication, D-drive and line justification.
Abstract: This paper deals with the use and development of high-level (functional) primitive logic elements for use in a system which automatically generates tests for complex sequential circuits. The concept of solution sequences to test problems for primitive elements is introduced and a functional language used to describe solution sequences is presented. Functional test generation models for two basic elements, a shift register and a counter, are derived, including procedures for implication, D-drive and line justification. Primitive algorithms which generate single as well as multivector (sequences) solutions to D-drive and line justification problems are presented.
66 citations
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TL;DR: A test-grading technique that uses the method of output deviations for screening small-delay defects (SDDs) and a new gate-delay defect probability measure is defined to model delay variations for nanometer technologies.
Abstract: Timing-related defects are major contributors to test escapes and in-field reliability problems for very-deep submicrometer integrated circuits. Small delay variations induced by crosstalk, process variations, power-supply noise, as well as resistive opens and shorts can potentially cause timing failures in a design, thereby leading to quality and reliability concerns. We present a test-grading technique that uses the method of output deviations for screening small-delay defects (SDDs). A new gate-delay defect probability measure is defined to model delay variations for nanometer technologies. The proposed technique intelligently selects the best set of patterns for SDD detection from an n-detect pattern set generated using timing-unaware automatic test-pattern generation (ATPG). It offers significantly lower computational complexity and excites a larger number of long paths compared to a current generation commercial timing-aware ATPG tool. Our results also show that, for the same pattern count, the selected patterns provide more effective coverage ramp-up than timing-aware ATPG and a recent pattern-selection method for random SDDs potentially caused by resistive shorts, resistive opens, and process variations.
66 citations
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IBM1
TL;DR: Disclosed as mentioned in this paper is a test method and system for boundary testing a circuit network, made up of individual integrated circuit chips mounted on a printed circuit card or board, has at least one integrated circuit that is testable by IEEE 1149.1 Standard boundary testing, and at least two second integrated circuits that are tested by Level Sensitive Scan Design boundary testing but not by IEEE 802.15.1 standard boundary testing.
Abstract: Disclosed is a test method and system for boundary testing a circuit network. The network, made up of individual integrated circuit chips mounted on a printed circuit card or board, has at least one integrated circuit that is testable by IEEE 1149.1 Standard boundary testing, and at least one second integrated circuit that is testable by Level Sensitive Scan Design boundary testing but not by IEEE 1149.1 Standard boundary testing. The test system has a test access port interface with a test access port controller with Test Clock, Test Data In, Test Data Out, Test Mode Select, and Test Reset I/O. The test access port also has an instruction register, a bypass register, a test clock generator, and a Level Sensitive Scan Device boundary scan register.
66 citations
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13 Nov 1997TL;DR: A flexible and efficient approach to evaluating implications as well as deriving indirect implications in logic circuits based on a graph model of a circuit's clause description called implication graph which combines both the flexibility of SAT-based techniques and high efficiency of structure based methods.
Abstract: The paper presents a flexible and efficient approach to evaluating implications as well as deriving indirect implications in logic circuits. Evaluation and derivation of implications are essential in ATPG, equivalence checking, and netlist optimization. Contrary to other methods, the approach is based on a graph model of a circuit's clause description called implication graph. It combines both the flexibility of SAT-based techniques and high efficiency of structure based methods. As the proposed algorithms operate only on the implication graph, they are independent of the chosen logic. Evaluation of implications and computation of indirect implications are performed by simple and efficient graph algorithms. Experimental results for various applications relying on implication demonstrate the effectiveness of the approach.
66 citations