Topic
Automatic test pattern generation
About: Automatic test pattern generation is a research topic. Over the lifetime, 8214 publications have been published within this topic receiving 140773 citations. The topic is also known as: ATPG.
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IBM1
TL;DR: A diagnosis system that can diagnose faults in a scan chain so that the manufacturing process or physical design can be filed to improve yield is described.
Abstract: Testing screens for good chips. However, when test fall out is high (low yield) it becomes necessary to diagnose faults so that the manufacturing process or physical design can be filed to improve yield. Several scan based diagnostic schemes are used in industry. They work when the scan chain itself is fault free. In this paper we describe a diagnosis system that can diagnose faults in a scan chain. >
65 citations
TL;DR: This paper proposes the first approach for automated testing of flow-based microfluidic biochips that are designed using membrane-based valves for flow control that is based on a behavioral abstraction of physical defects in microchannels and valves.
Abstract: Recent advances in flow-based microfluidics have led to the emergence of biochemistry-on-a-chip as a new paradigm in clinical diagnostics and biomolecular recognition. However, a potential roadblock in the deployment of microfluidic biochips is the lack of test techniques to screen defective devices before they are used for biochemical analysis. Defective chips lead to repetition of experiments, which is undesirable due to high reagent cost and limited availability of samples. Prior work on fault detection in biochips has been limited to digital (“droplet”) microfluidics and other electrode-based technology platforms. The paper proposes the first approach for automated testing of flow-based microfluidic biochips that are designed using membrane-based valves for flow control. The proposed test technique is based on a behavioral abstraction of physical defects in microchannels and valves. The flow paths and flow control in the microfluidic device are modeled as a logic circuit composed of Boolean gates, which allows test generation to be carried out using standard automatic test pattern generation tools. The tests derived using the logic circuit model are then mapped to fluidic operations involving pumps and pressure sensors in the biochip. Feedback from pressure sensors can be compared to expected responses based on the logic circuit model, whereby the types and positions of defects are identified. We show how a fabricated biochip can be tested using the proposed method, and demonstrate experimental results for two additional fabricated chips.
65 citations
TL;DR: The efficacy of the proposed approach is assessed on a number of programs and the empirical results indicate that its performance is significantly better compared to existing dynamic test data generation methods.
65 citations
01 May 1998
TL;DR: This paper proposes a new methodology for resting a core-based system-on-chip (SOC), targeting the simultaneous reduction of test area overhead and test application time, and demonstrates the ability to design highly testable SOCs with minimized test Area overhead, minimized test applicationTime, or a desired trade-off between the two.
Abstract: This paper proposes a new methodology for resting a core-based system-on-chip (SOC), targeting the simultaneous reduction of test area overhead and test application time. Testing of embedded cores is achieved using the transparency properties of surrounding cores. At the core level, testability and transparency can be achieved by reusing existing logic inside the core, and providing different versions of the core having different area overheads and transparency latencies. At the chip level, the technique analyzes the topology of the SOC to select the core versions that best meet the user's desired test area overhead and test application time objectives. Application of the method to example SOCs demonstrates the ability to design highly testable SOCs with minimized test area overhead, minimized test application time, or a desired trade-off between the two. Significant reduction in area overhead and test application time compared to an existing SOC testing technique is also demonstrated.
65 citations
TL;DR: Test statement insertion (TSI), an alternative to test point insertion and partial scan, is used to modify the circuit based on the selected test points, which has the major advantage of using TSI is a low pin count and test application time as compared to testPoint insertion andpartial scan.
Abstract: In this paper, a behavioral synthesis for testability system is presented. In this system, a testability modifier is connected to an existing behavioral level synthesis program, which accepts a circuit's behavioral description in C or VHDL as input. The outline of the system is as follows: (1) a testability analyzer is first applied to identify the hard-to-test areas in the circuit from the behavioral description; (2) a selection process is then applied to select test points or partial scan flip-flops. Selection is based on behavioral information rather than low-level structural description. This allows test point insertion or partial scan usage on circuits described as an interconnection of high level modules; (3) test statement insertion (TSI), an alternative to test point insertion and partial scan, is used to modify the circuit based on the selected test points. The major advantage of using TSI is a low pin count and test application time as compared to test point insertion and partial scan. In addition, TSI can be applied at the early design phase. This approach was implemented in a computer program, and applied to several sample circuits generated by a synthesis tool. The results are also presented. >
64 citations