Biasing

About: Biasing is a research topic. Over the lifetime, 29422 publications have been published within this topic receiving 301035 citations.

Raman spectroscopic evidence for hot-phonon generation in electrically biased carbon nanotubes.

Abstract: We provide spectroscopic evidence for hot-phonon generation in biased single-walled carbon nanotubes by measuring simultaneously the Stokes and anti-Stokes Raman lines of the G mode and of the radial-breathing mode as a function of current bias. Using Bose-Einstein statistics we can directly calculate the phonon temperature from the intensity ratio of the anti-Stokes to Stokes lines. Upon nanotube biasing we observe (i) an increase of the G mode phonon temperature in contrast to the radial-breathing mode phonons that remain thermalized at room temperature, and (ii) no softening of the G mode. Based on these observations, we exclude current-induced thermal heating of the nanotube.

Electrical Properties and Stability of Dual-Gate Coplanar Homojunction DC Sputtered Amorphous Indium–Gallium–Zinc–Oxide Thin-Film Transistors and Its Application to AM-OLEDs

Abstract: The electrical characteristics and stability of dual-gate (DG) coplanar homojunction amorphous indium-gallium-zinc-oxide thin-film transistors (a-IGZO TFTs) on glass substrates are described herein. In this device structure, both top gate (TG) and bottom gate are defined by lithography, allowing independent biasing when adjacent TFTs are present. The DG a-IGZO TFT demonstrates excellent electrical performance with subthreshold swing (SS) of 99 mV/dec, field-effect mobility of 15.1 , and on- off current ratio of . By applying various bias voltages on the TG electrode, it is found that the TFT threshold voltage can be controlled without any change of the SS and off current. Under conditions of negative bias temperature stress (BTS), the transfer curves of the TFT exhibit negligible shifts after 10 000 s. Larger shifts are observed under conditions of a positive BTS. Finally, the application of this DG device to active-matrix organic light-emitting displays is suggested.

Compact InAlAs–InGaAs Metal– Semiconductor– Metal Photodetectors Integrated on Silicon-on-Insulator Waveguides

Abstract: We present measurement results of compact and efficient InAlAs-InGaAs metal-semiconductor-metal photodetectors integrated on silicon-on-insulator (SOI) waveguides. These thin-film devices are heterogeneously integrated on the SOI substrate by means of low-temperature die-to-wafer bonding using divinyldisiloxane benzocyclobutene (DVS-BCB). The responsivity of a 30-mum-long detector is 1.0 A/W at a wavelength of 1550 nm and the dark current is 4.5 nA at a bias voltage of 5 V.

Nanofabrication of thin chromium film deposited on si(100) surfaces by tip induced anodization in atomic force microscopy

Abstract: Writing of nanostructures on thin metal films using atomic force microscopy (AFM) was demonstrated. The writing experiments were done in a nitrogen ambient having variable humidity. Using a p‐type heavily doped silicon AFM tip, a bias voltage was independently applied between the tip and the surface of a thin chromium layer deposited on a Si(100) substrate. Protruded patterns of various shapes were formed only on the water‐adsorbed chromium surface when applying a negative bias on the tip. Their sizes were found to be dependent on the writing time, the bias voltage, and the humidity. The smallest feature size obtained is about 20 nm. From Auger electron spectroscopy (AES) analysis, the products are shown to be Cr oxides. The surface modification mechanism appears to be tip‐induced local oxidation, i.e., anodization.

Low-Noise CMOS single-photon avalanche diodes with 32 ns dead time

Abstract: The implementation of single-photon avalanche diode detectors (SPAD) in a standard high voltage 0.7-mum CMOS technology is presented. Two different device structures, combined with integrated quenching circuits, have been fabricated and successfully tested. A novel biasing scheme is proposed allowing the reduction of afterpulsing effect and the decrease of minimum device-to-device distance. Good noise performance is obtained for the 100 mum2 active area device where over 50% of the population has a dark count rate below lOOcps and afterpulsing lower than 0.3% with a 4-V excess bias and a 32-ns dead time. The peak photon detection probability is about 30%, while the overall system, upper limit, for the time resolution is 144 ps.