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Blisters

About: Blisters is a research topic. Over the lifetime, 980 publications have been published within this topic receiving 16229 citations.


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Patent
30 May 2008
TL;DR: In this paper, a method of transferring a plurality of tablets of a product from a first blister card comprising a first plurality of blisters to a second blister card consisting of a second plurality of bimodal blisters is described.
Abstract: A method of transferring a plurality of tablets of a product from a first blister card comprising a first plurality of blisters to a second blister card comprising a second plurality of blisters includes discharging the plurality of tablets from the first plurality of blisters of the first blister card. Then, each of the plurality of tablets are guided along one of a plurality of passageways defined by a transfer fixture positioned between the first blister card and the second blister card. Finally, the plurality of tablets are received in the second plurality of blisters of the second blister card. The method includes monitoring the deposit of product to the blister card and verifying the contents of the blister card.

5 citations

Journal ArticleDOI
TL;DR: In this article , surface morphology and internal microstructure of tungsten (W) pre-implanted by 40 keV mass-separated helium (He) ions with different fluences at room temperature were investigated.
Abstract: Surface morphology and internal microstructure of tungsten (W) pre-implanted by 40 keV mass-separated helium (He) ions with different fluences at room temperature were investigated in this work. The morphology changes of the samples were analyzed almost in situ, by repetitively examined the specified irradiation area which is marked by focused ion beam technology. As the samples were implanted by He ion with a fluence of 6 × 1020 He m−2, no He blisters or other microstructures could be found on the surface. When the fluence reaches 6 × 1021 He m−2, a large number of He blisters with the size of ∼1 μm were observed on the W specimens. For the results of the subsequent deuterium plasma exposure, instead of deuterium-induced blistering, no changes on the W surface which pre-irradiated by He ion irradiation at low fluence (6 × 1020 He m−2). Surprisingly, for He ions pre-implanted W with high fluence (6 × 1021 He m−2), almost all the He blisters were cracked and their lids even peeled off. It could be attributed to the lateral stress caused by subsequent D exposure. Moreover, the size of He bubbles was also increased under subsequent deuterium exposure, suggesting that He atoms can attract D atoms. No deuterium blisters were found on these samples which were pre-implanted with high and low fluences, suggesting that He ion pre implantation can effectively inhibit the surface blistering caused by deuterium exposure.

5 citations

Journal ArticleDOI
TL;DR: In this article, the impact of high-energy irradiations of a plasma focus device, including pure Hydrogen (H) ions, pure Helium (He), and 50−50 H +He mixture was assessed.

5 citations

Journal ArticleDOI
TL;DR: The surface damage of insulating ceramic coatings on Hastelloy X and Nb-1 percent Zr held at room temperature and at 300/sup 0/C has been studied for both 100- and 250-keV helium ion irradiation for a dose range from 3.7 x 10/sup 18/ to 1 x 10 /sup 19/ ions cm/sup -2 as mentioned in this paper.
Abstract: The surface damage of insulating ceramic coatings on Hastelloy X and Nb--1 percent Zr held at room temperature and at 300/sup 0/C has been studied for both 100- and 250-keV helium ion irradiation for a dose range from 3.7 x 10/sup 18/ to 1 x 10/sup 19/ ions cm/sup -2/. Blisters were observed after room temperature irradiation with both 100- and 250-keV helium ions. However, for irradiation at 300/sup 0/C no blisters could be observed. The sharp rise in the helium permeation with temperature, observed by others for some glasses and ceramics, is thought to be responsible for this behavior. These results suggest that for the energy range studied, helium blistering has a negligible surface erosion effect on such coatings if they are operated at temperatures above 300/sup 0/C.

5 citations

Journal ArticleDOI
TL;DR: The laser-induced damage behaviors of chirped mirrors (CMs) are studied by single 800 nm, 38 fs lasers and a adiabatic expansion model of ideal gas is adopted to illustrate the formation dynamics of blisters.
Abstract: The laser-induced damage behaviors of chirped mirrors (CMs) are studied by single 800 nm, 38 fs lasers. The CMs provide group delay dispersion of around −60 fs2 and average reflectivity of about 99.4% with bandwidth range of 200–300 nm at a central wavelength of 800 nm. Interestingly, a circular blister feature appears in the CMs at a wide range of laser fluence. An optical microscope, atomic force microscope, scanning electron microscope, and surface profiler are applied to describe the blister characteristics. An adiabatic expansion model of ideal gas is adopted to illustrate the formation dynamics of blisters. The evolution of blisters can be explained by partial evaporation of the film and a subsequent gas expansion, driving the bulging of the film stack up to the stress limit, where the blister fractures. According to this model, the energy absorption ratio of blisters increases monotonously with increasing laser fluence before the occurrence of the focal spot confinement effect.

5 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202353
2022133
202118
202036
201922
201846