Blisters

About: Blisters is a research topic. Over the lifetime, 980 publications have been published within this topic receiving 16229 citations.

Tape blisters that develop after hip fracture surgery: A retrospective series and a review of the literature

Abstract: A tape blister, a skin excoriation that occurs under the taped portion of surgical bandages, can be a source of postoperative morbidity. Tape blisters are caused by the separation of the epidermis from the dermis at the dermal-epidermal junction. Tape resistant to stretching contributes to blister formation because of the concentration of forces at the ends of the tape. Although tape blisters are a pervasive clinical problem, their incidence after hip surgery has rarely been reported in the orthopedic literature. Therefore, we retrospectively reviewed a consecutive series of patients with hip fractures to determine the incidence of tape blisters at our institution. One hundred three patients were included in the study. Tape-related injuries occurred in 22 patients (21.4%). Patient age, patient sex, number of medical comorbidities, smoking history, nutritional status, and type of surgery were not statistically significantly associated with risk for developing tape blisters.

Damage evolution and surface morphology of helium implanted yttria-stabilized zirconia single crystal

Abstract: The effects of helium ion implantation on the surface morphology of (1 0 0)-oriented yttria-stabilized zirconia (YSZ) single crystals have been studied. Ion implantation at various fluences in the range 0.01–5.1 × 10 16 He-atoms/cm 2 has been carried out at room temperature using a 2.74 MeV He + ion beam passing through a 8.0 μm Al foil. The microstructure and surface morphology of the irradiated surface are examined using atomic force microscopy. Rutherford backscattering spectrometry combined with the channeling technique is applied for the investigation of lattice damage and for the thickness determination of the implanted layer. The ion-irradiated areas are found to protrude to different heights in nm scale. The fluence dependence of the magnitude of rms roughness exhibits a very sharp increase with the increase of the ion dose at higher fluences and in a narrow range between 2 × 10 16 and 5.1 × 10 16 cm −2 , which is preceded by a linear increase at lower fluences. Given a sufficient concentration for implanted He, above 2 × 10 16 cm −2 , surface blistering occurs directly during implantation. The size and distribution of blisters are dependent on the total helium content. For the specimen with a fluence 4.0 × 10 16 cm −2 , an annealing has been conducted at 300 °C. After the annealing, some of the blisters are found to become larger in size, up to about 10 μm in diameter and 1 μm in height without rupture. Within the present experimental conditions, no signature of any surface exfoliation or flaking in YSZ is observed. A tentative explanation of the results is presented.

PUVA-Induced Blisters, Complement Deposition, and Damage to the Dermoepidermal Junction

Abstract: • We followed the course of 56 patients receiving psoralen plus long-wave ultraviolet light (PUVA) therapy. Nonhemorrhagic blisters developed on clinically normal skin on the limbs of seven patients. Seeming to be related to friction and trauma, the blisters form as a result of damage to the basal and suprabasal layers. Perilesional skin specimens from all blistered patients contained granular deposits of C3 at the dermoepidermal junction, around the upper dermal blood vessels, or at both sites. The average time for initiation and complete formation of suction blisters was measured in 51 patients at different stages during the course of PUVA treatment. Blister separation was in the lamina lucida, with the pemphigoid antigen in the roof while the blister floor contained the lamina densa, laminin, and type IV collagen. This impaired dermoepidermal adhesion was a general phenomenon that occurred in all PUVA-treated patients. The mechanism remains to be determined. ( Arch Dermatol 1987;123:1471-1477)

Semiempirical Theory on the Dependence of Blistering and Exfoliation on Radiation Sweeling and Gas Pressure

Abstract: The mechanism of blister formation and exfoliation of metal surfaces due to light ion bombardment (H,D,He) has been studied applying continuum mechanical theory of elastic plate deformation. Both the pressure of the implanted gas and the intrinsic stress due to radiation swelling of the bombardment material are taken into account. The results of the calculation show that only the combined action of stress forces and internal gas pressure lead to well defined blister diameters D, whereas gas pressure alone may cause exfoliation. The model is able to explain the experimental findings that the lid thickness (deckeldicke”) t of blisters is larger than the mean range of the ions and the 3/2 relation D∝ t3/2 holds over the energy range from 1 to 2000 keV. Transition from blistering to exfoliation is predicted as gas pressure becomes more important than stress, e.g. if stress is relieved during implantation at high temperatures.