Channelling

Abstract: The optical and structural properties of high-quality single-crystal epitaxial MgZnO films deposited by pulsed-laser deposition were studied. In films with up to ∼36 at. % Mg incorporation, we have observed intense ultraviolet band edge photoluminescence at room temperature and 77 K. The highly efficient photoluminescence is indicative of the excitonic nature of the material. Transmission spectroscopy was used to show that the excitonic structure of the alloys was clearly visible at room temperature. High-resolution transmission electron microscopy, x-ray diffraction, and Rutherford backscattering spectroscopy/ion channeling were used to verify the epitaxial single-crystal quality of the films and characterize the defect content. Post-deposition annealing in oxygen was found to reduce the number of defects and to improve the optical properties of the films. These results indicate that MgZnO alloys have potential applications in a variety of optoelectronic devices.

Abstract: Millions of years of evolution have produced biological systems capable of efficient one-pot multi-step catalysis. The underlying mechanisms that facilitate these reaction processes are increasingly providing inspiration in synthetic chemistry. Substrate channelling, where intermediates between enzymatic steps are not in equilibrium with the bulk solution, enables increased efficiencies and yields in reaction and diffusion processes. Here, we review different mechanisms of substrate channelling found in nature and provide an overview of the analytical methods used to quantify these effects. The incorporation of substrate channelling into synthetic cascades is a rapidly developing concept, and recent examples of the fabrication of cascades with controlled diffusion and flux of intermediates are presented.

Abstract: Electron channelling contrast imaging (ECCI) is a powerful technique for observing crystal defects, such as dislocations, stacking faults, twins and grain boundaries in the scanning electron microscope. Electron channelling contrast (ECC) is strongest when the primary electron beam excites so called two-beam diffraction conditions in the crystal. In the present approach this is achieved, by a combination of crystal orientation measurement using electron backscatter diffraction (EBSD) and simulation of electron channelling patterns. From the latter, the crystal is rotated such that two-beam diffraction conditions are achieved. This technique is called “ECCI under controlled diffraction conditions” or cECCI. Following an extensive literature review, this paper presents a simple, yet instructive and demonstrative treatment of the theory of ECC of lattice defects based on Bloch wave theory using a two-beam approach. This is followed by a discussion of technical issues associated with an ideal ECC set-up such as optimum detector position and microscope conditions. Subsequently, the appearance of different types of lattice defects under ECCI conditions; namely of dislocations, stacking faults, slip lines, and nanotwins, is discussed in detail. It is shown how different types of defects are distinguished and which type of crystallographic information can be extracted from such observations. Finally, the limits of the technique, particularly in terms of spatial resolution and depth of visibility are discussed and a comparison with the EBSD and transmission electron microscopy techniques with respect to imaging lattice defects is provided. In contrast to many investigations recently published in the literature, the current paper focuses on ‘true’ backscattering, i.e. on a signal that is recorded with a conventional backscatter detector positioned below the pole piece, and not on forward scattering, where the signal is recorded on a detector usually positioned below the EBSD detector. This has significant advantages in terms of spatial resolution and contrast, which are discussed in the text.

Abstract: The three scanning electron microscope diffraction based techniques of electron channelling patterns (ECPs), electron channelling constrast imaging (ECCI), and electron backscatter diffraction (EBSD) are reviewed. The dynamical diffraction theory is used to describe the physics of electron channelling, and hence the constrast observed in ECPs (and EBSD) and ECCI images of dislocations. Models for calculating channelling contrast are described and their limitations discussed. The practicalities of the experimental methods, including detector-specimen configurations, spatial resolution and sensitivities are given. Examples are given of the use of ECCI for imaging and characterising lattice defects, both individually and in groups, in semiconductor heterostructures and fatigued metals. Applications of the EBSD technique to orientation determination, phase identification and strain measurement are given and compared with use of ECPs. It is concluded that these techniques make the SEM a powerful instrument for characterising the local crystallography of bulk materials at the mesoscopic scale.

Abstract: Ion-Solid Interactions Principles of the Nuclear Microprobe Microprobe Ion Optics Analytical Techniques Spatially Resolved Ion Channelling Techniques Ion Beam Induced Charge Microscopy Microelectronics Analysis Crystal Defect Imaging with a Nuclear Microprobe Other Materials Analysis and Modification.