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Chemical state
About: Chemical state is a research topic. Over the lifetime, 2378 publications have been published within this topic receiving 78183 citations.
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TL;DR: In this article, the deuterium desorption process in two stages was attributed to the desoration processes from the trapping sites of B-D and C-D bonds.
10 citations
01 Feb 1998-Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms
TL;DR: In this paper, the possibility of the formation of C-N compounds in diamond films was investigated by means of X-ray photoelectron spectroscopy (XPS) scanning electron microscope (SEM), Xray diffraction analysis (XRD), Fourier transform infrared absorption spectrograms (FTIR) and Raman spectroscopic analysis (RSA).
Abstract: Diamond films were implanted with 50–110 keV N ions to the dosage of 1 × 10 17 ions/cm 2 at the temperature below 80°C. The possibility of the formation of C–N compounds in diamond films was investigated by means of X-ray photoelectron spectroscopy (XPS) scanning electron microscope (SEM), X-ray diffraction analysis (XRD), Fourier transform infrared absorption spectroscopy (FTIR) and Raman spectroscopy. For the first time, the new evidence about the formation of plenty of C–N single bonds which is necessary for β -C 3 N 4 formation in the diamond films has been presented. It is found that the low energy ion was suitable for the formation of C–N compound. The XPS analysis indicate that both C and N form three types of chemical states. FTIR and Raman spectra show that a large number of the C–N covalent bond have been formed. XRD and Raman analysis indicate that the structure of implanted layer is amorphous. The electrical resistivity in the implanted layer exhibits diamond-like property.
10 citations
TL;DR: In this article, the authors used a variety of numerical methods, such as linear least squares fitting and target factor analysis, to improve the analysis and interpretation of depth profiles and in most cases significantly improved the detection limits of specific elements.
Abstract: X‐ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) have long been used for sputter depth profiling for the determination of sample chemical composition as a function of depth. Often in XPS and AES, peak overlap or a subtle change in chemistry makes the chemical analysis of the elements in a material difficult. By using a variety of numerical methods, such as linear least squares fitting and target factor analysis, it is possible to improve the analysis and interpretation of depth profiles. The use of numerical methods can aid in the interpretation of chemical state information and in most cases significantly improves the detection limits of specific elements. An XPS sputter depth profile of tantalum silicide on silicon and an AES profile of a multilayer structure of gold, tantalum, and silicon carbide are shown as examples of the improvements offered by applying numerical methods.
9 citations
TL;DR: In this article, a state analysis of steel surfaces covered with iron oxides and fluorides was performed using the 9th-order FeKα1 line, which was effective for the analysis of iron compounds especially when the compounds were thicker than the detection depth.
Abstract: Chemical states of steel surfaces covered with iron oxides and fluorides were analyzed by a state analysis method utilizing the 9th-order FeKα1 line. The method was effective for the state analysis of iron compounds especially when the compounds were thicker than the detection depth of the FeKα1 line.
9 citations
TL;DR: In this paper, a representative specimen by means of x-ray photoelectron spectroscopy was analyzed and a detailed analysis of C 1s, O 1s and F 1s peaks were presented and discussed.
Abstract: Supported Mn(IV) oxide nanomaterials were prepared by plasma assisted-chemical vapor deposition from Ar/O2 plasmas starting from a fluorinated Mn(II) β-diketonate diamine adduct. Under the adopted conditions, the target compound served as a single-source molecular precursor for the obtainment of MnO2 nanosystems uniformly doped with fluorine. The overall F content in the target materials, composed of phase-pure β-MnO2, could be tailored as a function of the deposition temperature from 100 to 400 °C, a result of particular importance in view of photocatalytic and gas sensing applications. In the present study, attention is specifically devoted to the investigation of a representative specimen by means of x-ray photoelectron spectroscopy. Besides the wide scan spectrum, a detailed analysis of C 1s, O 1s, Mn 2p, Mn 3s, and F 1s photoelectron peaks is presented and discussed. The analyses reveal the formation of MnO2 free from other manganese oxides, with fluorine present in different chemical states, i.e., lattice F plus traces of precursor residuals at the system surface.
9 citations