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Chemical state

About: Chemical state is a research topic. Over the lifetime, 2378 publications have been published within this topic receiving 78183 citations.


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TL;DR: In this paper, the composition and chemical state of Ti-Al-N thin films were measured using X-ray photoelectron spectroscopy, and the functional properties of the thin films prepared by the dynamic ion mixing method at various energies were investigated with respect to hardness, wear resistance and corrosion resistance.
Abstract: Aluminium titanium nitride (Ti-Al-N) is anticipated as an advanced coating film with wear resistance used for drills, bites etc. and with corrosion resistance at a high temperature. Almost all the formations of Ti-Al-N films reported in the literature had been carried out by a reactive sputtering method. Delicate control for the composition of a Ti-Al-N film is difficult for the reactive sputtering method because of using the Ti-Al target made with a fixed composition. The dynamic ion mixing method used in this experiment can finely control the film composition using two electron beam evaporation sources, thereby setting the Ti and Al contents. In this study, the composition and chemical state of Ti-Al-N thin films are measured using X-ray photoelectron spectroscopy. When the Ti-Al-N thin film has a Ti : Al : N composition ratio of 1:1:1, the chemical shifts of the Ti 2p and the Al 2p line are 0.9 eV and 1.2 eV from the metallic states of Ti and Al respectively. These chemical shifts are smaller than those of standard TiN and AlN, because one nitrogen atom joins to both a titanium atom and an aluminum atom. The functional properties of Ti-Al-N thin films prepared by the dynamic ion mixing method at various energies are investigated with respect to hardness, wear resistance and corrosion resistance. The highest hardness and the highest corrosion resistance of Ti-Al-N thin films are observed for an ion beam energy of 10 keV. In the case of the wear resistance, the friction coefficient may be independent of the ion beam energy.

6 citations

Journal ArticleDOI
TL;DR: In this article, an analysis of X-ray photoelectron spectroscopy (XPS) images of cosputtered titanium dioxide (TiO2) films was performed by cosputtering titanium (Ti) target and SiO2 or Si slice with ion-beam-sputtering deposition (IBSD) technique and were postannealed at 450°C for 6h.

6 citations

Journal ArticleDOI
TL;DR: In this paper, the authors compare synchrotron-based X-ray photoelectron spectroscopy (NAP-XPS) results recorded at 300°C on Ni/yttria-stabilized zirconia cermet and La 0.75 Sr 0.25 Cr 0.9 Fe 0.1 O 3 perovskite, under 3.5 mbar O 2 and UHV environments.

6 citations

Journal ArticleDOI
TL;DR: In this article, a depth profiling by ion beam sputtering caused collisional mixing of the subsurface region, which modifies the XPS signal, and the results indicate possible improvement of the depth profiling XPS method to be used in future experiments.
Abstract: During annealing at 950°C in an oxidizing ambient, the redistribution of Ge in Ge + -implanted SiO 2 layer is influenced by the germanium oxidation. Crystalline clusters precipitate immediately after sample heating. During the annealing an oxidation front proceeds into the layer, consuming crystalline clusters and leaving behind glassy precipitates barely visible by XTEM. Sputtering depth profiling in conjunction with the X-ray photoelectron spectroscopy (XPS) analysis was applied in order to identify the chemical state of both the precipitated Ge and that dissolved in the silicon dioxide matrix. For a reliable interpretation of the measured data, modeling of the physical processes involved in the depth profiling XPS technique was performed. It is shown that the depth profiling by ion beam sputtering causes collisional mixing of the subsurface region, which modifies the XPS signal. The results indicate possible improvement of the depth profiling XPS method to be used in future experiments.

6 citations

Journal ArticleDOI
TL;DR: Fluorescence method is displayed using an energy-dispersive pnCCD detector, the SLcam, characterized by measurement times far superior to what is generally applicable, thus providing direct 3D spatially resolved chemical state information from a selected subvolume of a sample, without the need of rotating a sample.
Abstract: Using X-ray absorption near edge structure (XANES) spectroscopy, information on the local chemical structure and oxidation state of an element of interest can be acquired. Conventionally, this information can be obtained in a spatially resolved manner by scanning a sample through a focused X-ray beam. Recently, full-field methods have been developed to obtain direct 2D chemical state information by imaging a large sample area. These methods are usually in transmission mode, thus restricting the use to thin and transmitting samples. Here, a fluorescence method is displayed using an energy-dispersive pnCCD detector, the SLcam, characterized by measurement times far superior to what is generally applicable. Additionally, this method operates in confocal mode, thus providing direct 3D spatially resolved chemical state information from a selected subvolume of a sample, without the need of rotating a sample. The method is applied to two samples: a gold-supported magnesia catalyst (Au/MgO) and a natural diamond ...

6 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202326
202249
202184
202089
201987
201894