Comparator

About: Comparator is a research topic. Over the lifetime, 28095 publications have been published within this topic receiving 174862 citations.

A 15-b 1-Msample/s digitally self-calibrated pipeline ADC

Abstract: A 15-b 1-Msample/s digitally self-calibrated pipeline analog-to-digital converter (ADC) is presented. A radix 1.93, 1 b per stage design is employed. The digital self-calibration accounts for capacitor mismatch, comparator offset, charge injection, finite op-amp gain, and capacitor nonlinearity contributing to DNL. A THD of -90 dB was measured with a 9.8756-kHz sine-wave input. The DNL was measured to be within +or-0.25 LSB at 15 b, and the INL was measured to be within +or-1.25 LSB at 15 b. The die area is 9.3 mm*8.3 mm and operates on +or-4-V power supply with 1.8-W power dissipation. The ADC is fabricated in an 11-V, 4-GHz, 2.4- mu m BiCMOS process. >

A versatile building block: the CMOS differential difference amplifier

Abstract: An extension of the op-amp concept featuring two differential inputs is presented. In a closed-loop environment this circuit forces two floating voltages to the same value, and thus has many interesting applications in the analog circuit domain. A description of such a circuit, its nonidealities, and restrictions are given. A monolithic integration of this differential difference amplifier is implemented in a double-poly CMOS technology, its measured characteristics are described. Many applications of this circuit, including a voltage comparator with floating inputs, a voltage inverter without resistors, and an instrumentation amplifier with only two external gain determining resistors, are discussed.

A 10000 frames/s CMOS digital pixel sensor

Abstract: A 352/spl times/288 pixel CMOS image sensor chip with per-pixel single-slope ADC and dynamic memory in a standard digital 0.18-/spl mu/m CMOS process is described. The chip performs "snapshot" image acquisition, parallel 8-bit A/D conversion, and digital readout at continuous rate of 10000 frames/s or 1 Gpixels/s with power consumption of 50 mW. Each pixel consists of a photogate circuit, a three-stage comparator, and an 8-bit 3T dynamic memory comprising a total of 37 transistors in 9.4/spl times/9.4 /spl mu/m with a fill factor of 15%. The photogate quantum efficiency is 13.6%, and the sensor conversion gain is 13.1 /spl mu/V/e/sup -/. At 1000 frames/s, measured integral nonlinearity is 0.22% over a 1-V range, rms temporal noise with digital CDS is 0.15%, and rms FPN with digital CDS is 0.027%. When operated at low frame rates, on-chip power management circuits permit complete powerdown between each frame conversion and readout. The digitized pixel data is read out over a 64-bit (8-pixel) wide bus operating at 167 MHz, i.e., over 1.33 GB/s. The chip is suitable for general high-speed imaging applications as well as for the implementation of several still and standard video rate applications that benefit from high-speed capture, such as dynamic range enhancement, motion estimation and compensation, and image stabilization.

A low-noise self-calibrating dynamic comparator for high-speed ADCs

Abstract: This paper presents a low offset voltage, low noise dynamic latched comparator using a self-calibrating technique. The new calibration technique does not require any amplifiers for the offset voltage cancellation and quiescent current. It achieves low offset voltage of 1.69 mV at 1 sigma in low power consumption, while 13.7 mV is measured without calibration. Furthermore the proposed comparator requires only one phase clock while conventionally two phase clocks were required leading to relaxed clock. Moreover, a low input noise of 0.6 mV at 1 sigma, three times lower than the conventional one, is obtained. Prototype comparators are realized in 90 nm 10M1P CMOS technology. Experimental and simulated results show that the comparator achieves 1.69 mV offset at 250 MHz operating, while dissipating 40 muW/GHz ( 20 fJ/conv. ) from a 1.0 V supply.

A 10-bit Charge-Redistribution ADC Consuming 1.9 $\mu$ W at 1 MS/s

Abstract: This paper presents a 10 bit successive approximation ADC in 65 nm CMOS that benefits from technology scaling. It meets extremely low power requirements by using a charge-redistribution DAC that uses step-wise charging, a dynamic two-stage comparator and a delay-line-based controller. The ADC requires no external reference current and uses only one external supply voltage of 1.0 V to 1.3 V. Its supply current is proportional to the sample rate (only dynamic power consumption). The ADC uses a chip area of approximately 115×225 μm2. At a sample rate of 1 MS/s and a supply voltage of 1.0 V, the 10 bit ADC consumes 1.9 μW and achieves an energy efficiency of 4.4 fJ/conversion-step.