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Conductive atomic force microscopy
About: Conductive atomic force microscopy is a research topic. Over the lifetime, 6365 publications have been published within this topic receiving 190958 citations.
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TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
Abstract: The scanning tunneling microscope is proposed as a method to measure forces as small as 10-18 N. As one application for this concept, we introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale. The atomic force microscope is a combination of the principles of the scanning tunneling microscope and the stylus profilometer. It incorporates a probe that does not damage the surface. Our preliminary results in air demonstrate a lateral resolution of 30 A and a vertical resolution less than 1 A.
12,344 citations
TL;DR: In this article, it was shown that carbon nanotubes might constitute well defined tips for scanning probe microscopy, and they were attached to the silicon cantilevers of conventional atomic force microscopes.
Abstract: SINCE the invention of the scanning tunnelling microscope1, the value of establishing a physical connection between the macroscopic world and individual nanometre-scale objects has become increasingly evident, both for probing these objects2–4 and for direct manipulation5–7 and fabrication8–10 at the nanometre scale. While good progress has been made in controlling the position of the macroscopic probe of such devices to sub-angstrom accuracy, and in designing sensitive detection schemes, less has been done to improve the probe tip itself4. Ideally the tip should be as precisely defined as the object under investigation, and should maintain its integrity after repeated use not only in high vacuum but also in air and water. The best tips currently used for scanning probe microscopy do sometimes achieve sub-nanometre resolution, but they seldom survive a 'tip crash' with the surface, and it is rarely clear what the atomic configuration of the tip is during imaging. Here we show that carbon nanotubes11,12 might constitute well defined tips for scanning probe microscopy. We have attached individual nanotubes several micrometres in length to the silicon cantilevers of conventional atomic force microscopes. Because of their flexibility, the tips are resistant to damage from tip crashes, while their slenderness permits imaging of sharp recesses in surface topography. We have also been able to exploit the electrical conductivity of nanotubes by using them for scanning tunnelling microscopy.
2,179 citations
TL;DR: The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation AFM (FM-AFM), as well as other dynamic methods as discussed by the authors.
Abstract: This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force microscopy (FM-AFM). This technique, as well as other dynamic methods, is explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened our theoretical understanding of frequency-modulation atomic force microscopy. Consequently spatial resolution and ease of use have been increased dramatically. Vacuum atomic force microscopy opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms.
1,948 citations
IBM1
TL;DR: Using an atomic force microscope, atomic-scale features on the frictional force acting on a tungsten wire tip sliding on the basal plane of a graphite surface at low loads are observed.
Abstract: Using an atomic force microscope, we have observed atomic-scale features on the frictional force acting on a tungsten wire tip sliding on the basal plane of a graphite surface at low loads, < 10-4 N. The atomic features have the periodicity of the graphite surface and are discussed in terms of a phenomenological model for the tip motion described by the sum of a periodic tip-surface force and the spring force exerted by the wire.
1,541 citations