Topic
Contact area
About: Contact area is a research topic. Over the lifetime, 12358 publications have been published within this topic receiving 256401 citations. The topic is also known as: contact patch & contact region.
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TL;DR: In this article, the effect of surface roughness on spreading of vegetable oils on stainless steel substrates was investigated and the results showed that low viscosity liquids exhibit improved wetting characteristics during spreading on rough surfaces.
96 citations
TL;DR: In this article, an analytical method that evaluates the evolution of stress and surface profile in fretting under the partial slip conditions is presented, based on two scales of time: time for one cycle of the oscillating tangential force and time corresponding to the number of cycles.
Abstract: An analytical method that evaluates the evolution of stress and surface profile in fretting under the partial slip conditions is presented. The repeated slip occurring near the edges of contact generates wear that changes the contact geometry and contact stresses. The method is based on two scales of time: time for one cycle of the oscillating tangential force and time corresponding to the number of cycles. Archard's wear law is used to evaluate wear and gap variation within the slip zones during one cycle. The governing integral equations are reduced to calculate the contact pressure after each cycle. Evolution of the contact characteristics (contact pressure and shear stress, contact width, gap and slip functions) in fretting is calculated using a stepwise procedure. It is shown that the size of stick zone does not change in wear process of bodies with similar elastic properties under the constant amplitude load conditions, and that an asymptotic solution corresponding to the number of cycles approaching to infinity exists. Analytical expressions for the asymptotic contact pressure, shear and tensile stress, and the gap function are presented. It is proved that the asymptotic contact pressure and shear stress are singular at the ends of stick zone. Detailed results are given for two initial shapes of elastic indenter contacting with an elastic half-space: for the parabolic cylinder and for the indenter having a flat base with rounded edges.
96 citations
TL;DR: Investigating mechanisms of attachment control in Asian weaver ants by measuring the dynamics of the adhesive contact area and the claws during locomotion gives evidence that running ants control their adhesive contact Area by a combination of active movements of the claw flexor muscle and passive reactions of the mechanical system.
96 citations
01 Aug 2007
TL;DR: In this article, the authors examined extant knowledge of how objects are gripped for manipulation, and the relationship, the coefficient of friction, between finger and object, has on various grip parameters.
Abstract: Gripping is an everyday task which is taken for granted by many. The current paper examines extant knowledge of howobjects are gripped for manipulation, and the relationship, the coefficient of friction, between finger and object, has on various grip parameters. It is found that friction is an essential part of the feedback and feedforward control system for grip. The friction of the finger-object contact can be measured in several different ways, using methods of either a probe moving on a finger or a finger moving on a flat surface. These friction measurements can then be used to gain information about the effect of normal force, sliding speed, contact area, and level of moisture present. They also can provide information about the changes between test subjects, for example, the effects of age, gender, and race. Knowing the effect of these parameters can help to improve the manoeuvrability of everyday items through inclusive design; designing products to be used by the whole population regardles...
95 citations
Patent•
IBM1
TL;DR: In this paper, a composite back-etch/lift-off stencil method is proposed to avoid the uncontrolled changes in the properties of contacts in small devices caused by the close proximity of the lift-off resist stencil to the contact area during the precleaning, surface preparation and metal deposition processes.
Abstract: This composite back-etch/lift-off stencil method avoids the uncontrolled changes in the properties of contacts in small devices caused by the close proximity of the lift-off resist stencil to the contact area during the precleaning, surface preparation and metal deposition processes. This method limits the area of the wafer exposed to back-etching and thus restores the freedom of choice of contact metallurgy. Back-etching is only applied in the areas of the wafer near to the contact holes; lift-off techniques are used for the rest of the integrated circuit.
95 citations