Topic
Contact resistance
About: Contact resistance is a research topic. Over the lifetime, 15262 publications have been published within this topic receiving 232144 citations. The topic is also known as: electrical contact resistance & ECR.
Papers published on a yearly basis
Papers
More filters
TL;DR: In this article, the parasitic resistance of different source/drain metals for top-gated graphene field effect transistors was extracted by fitting the measured ID-VG data with a resistance model and was found to be a significant part of the total resistance of graphene field-effect transistors.
Abstract: The parasitic resistance of different source/drain metals for top-gated graphene field-effect transistors was extracted by fitting the measured ID-VG data with a resistance model and was found to be a significant part of the total resistance of graphene field-effect transistors. The results show that Ti/Au gives relatively large contact resistance, about 7500 Ω·μm. Ni/Au contact shows better result compared to Ti/Au, which is around 2100 Ω·μm. The lowest contact resistance was given by Ti/Pd/Au, which is around 750 Ω·μm. The contact resistivity for Ti/Pd/Au source/drain contact is around 2 × 10−6 Ω·cm2, close to state of the art GaAs technology.
86 citations
TL;DR: In this article, a scheme for the investigation of transport phenomena in metallic single-wall carbon nanotubes by means of a special four-terminal measurement configuration was presented, which suppress the impact of the contacts on the measured conductance in a tube.
Abstract: The study of the intrinsic transport properties of carbon nanotubes suffers from the difficulties in fabricating noninvasive contacts. Here, we present a scheme for the investigation of transport phenomena in metallic single-wall carbon nanotubes by means of a special four-terminal measurement configuration. To suppress the impact of the contacts on the measured conductance in a tube, we found a combination of top and bottom contacts to the rope of single-wall nanotubes to be most appropriate. Our experimental findings demonstrate that a linear decrease of the sample resistance can be observed under these circumstances without the common increase of resistance for decreasing temperatures.
86 citations
TL;DR: In this article, the rise in contact resistance of a tin-plated copper alloy under cyclical minute motion has been studied for both dry circuit and with electrical loads, and a consistent picture of fretting corrosion and electrical conduction through such contacts is presented.
Abstract: The rise in contact resistance of a tin-plated copper alloy under cyclical minute motion has been studied for both dry circuit and with electrical loads. In the range of circuit voltage and current investigated, the electrical conduction through slightly corroded contacts is shown not to be affected by the electrical load. For moderately corroded contacts, the resistance characteristic shows a sustained plateau near the melting voltage of Sn; and for severely corroded contacts, plateau occurs in the resistance range corresponding to the voltage range of the melting, sublimation, and decomposition of the oxides and the vaporization of tin. Based on our observation, a consistent picture of fretting corrosion and electrical conduction through such contacts is presented.
86 citations
TL;DR: In this article, the electrical properties of polymer thin-film transistors (PTFTs) can be enhanced by controlling the solvent properties of poly(3,4-ethylenedioxythiophene) doped with poly(styrene sulfonate) (PEDOT/PSS) solution used as the inkjet printed source and drain electrodes.
Abstract: We show that the electrical properties of polymer thin-film transistors (PTFTs) can be enhanced by controlling the solvent properties of poly(3,4-ethylenedioxythiophene) doped with poly(styrene sulfonate) (PEDOT/PSS) solution used as the inkjet-printed source and drain electrodes. Specifically, addition of dimethyl sulfoxide (DMSO) into the PEDOT/PSS solution increased the conductivity of the inkjet-printed PEDOT electrodes and remarkably reduced the contact resistance of the electrodes. The lower contact resistance of the DMSO-treated PEDOT electrode compared to the corresponding electrode without DMSO treatment may be due to enhanced interfacial stability at the contact between the printed PEDOT electrodes and the semiconductor layers.
86 citations
TL;DR: In this article, a photothermal experiment is designed and conducted to characterize the thermal transport in carbon nanotubes (CNTs) along the axial direction exclusively, and the measured value demonstrates a sound thermal contact between them.
Abstract: In this work, a photothermal experiment is designed and conducted to characterize the thermal transport in carbon nanotubes (CNTs) along the axial direction exclusively. We characterize the thermal contact resistance between CNTs and the substrate. The measured value demonstrates a sound thermal contact between them. Our experimental result reveals a low thermal conductivity of the CNTs along their axial direction. The unique structure of the CNTs characterized in our work indicates that the thermal transport in the axial direction is across the carbon atomic layers. This explains why the measured thermal conductivity is much lower than theoretical predictions, in which the thermal conductivity is along the atomic layer direction. In addition, our transmission electron microscope observation of the CNTs reveals poor structural qualities, which can strongly enhance phonon scattering and reduce the thermal conductivity.
86 citations