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Contact resistance

About: Contact resistance is a research topic. Over the lifetime, 15262 publications have been published within this topic receiving 232144 citations. The topic is also known as: electrical contact resistance & ECR.


Papers
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Patent
11 Nov 2008
TL;DR: In this article, a plurality of openings having a minute contact area is provided instead of forming one penetrating opening having a large contact area to reduce a partial depression and also to ensure contact resistance.
Abstract: It is an object of the present invention to simplify steps needed to process a wiring in forming a multilayer wiring. In addition, when a droplet discharging technique or a nanoimprint technique is used to form a wiring in a contact hole having a comparatively long diameter, the wiring in accordance with the shape of the contact hole is formed, and the wiring portion of the contact hole is likely to have a depression compared with other portions. A penetrating opening is formed by irradiating a light-transmitting insulating film with laser light having high intensity and a pulse high in repetition frequency. A plurality of openings having a minute contact area is provided instead of forming one penetrating opening having a large contact area to have an even thickness of a wiring by reducing a partial depression and also to ensure contact resistance.

1,021 citations

Journal ArticleDOI
TL;DR: In this article, it was shown that the contact end resistance and the consequent specific contact resistance can be deduced from simple resistance measurements carried out between contacts on a standard, transmission line model test pattern.
Abstract: In characterizing ohmic contacts using the transmission line model, it is necessary to make a measurement referred to as the contact end resistance, as a result of modification to the sheet resistance under the contact. In this article we show that this contact end resistance and the consequent specific contact resistance can be deduced from simple resistance measurements carried out between contacts on a standard, transmission line model test pattern.

947 citations

Journal ArticleDOI
TL;DR: The design and first demonstration of high-performance n-type monolayer tungsten diselenide (WSe2) field effect transistors (FET) by selecting the contact metal based on understanding the physics of contact between metal and monolayers WSe2 corroborates the superb potential of WSe 2 for complementary digital logic applications.
Abstract: This work presents a systematic study toward the design and first demonstration of high-performance n-type monolayer tungsten diselenide (WSe2) field effect transistors (FET) by selecting the contact metal based on understanding the physics of contact between metal and monolayer WSe2. Device measurements supported by ab initio density functional theory (DFT) calculations indicate that the d-orbitals of the contact metal play a key role in forming low resistance ohmic contacts with monolayer WSe2. On the basis of this understanding, indium (In) leads to small ohmic contact resistance with WSe2 and consequently, back-gated In–WSe2 FETs attained a record ON-current of 210 μA/μm, which is the highest value achieved in any monolayer transition-metal dichalcogenide- (TMD) based FET to date. An electron mobility of 142 cm2/V·s (with an ON/OFF current ratio exceeding 106) is also achieved with In–WSe2 FETs at room temperature. This is the highest electron mobility reported for any back gated monolayer TMD materia...

868 citations

Journal ArticleDOI
Fengnian Xia1, Vasili Perebeinos1, Yu-Ming Lin1, Yanqing Wu1, Phaedon Avouris1 
TL;DR: It is reported that the contact resistance in a palladium-graphene junction exhibits an anomalous temperature dependence, dropping significantly as temperature decreases to a value of just 110 ± 20 Ω µm at 6 K, which is two to three times the minimum achievable resistance.
Abstract: A high-quality junction between graphene and metallic contacts is crucial in the creation of high-performance graphene transistors. In an ideal metal-graphene junction, the contact resistance is determined solely by the number of conduction modes in graphene. However, as yet, measurements of contact resistance have been inconsistent, and the factors that determine the contact resistance remain unclear. Here, we report that the contact resistance in a palladium-graphene junction exhibits an anomalous temperature dependence, dropping significantly as temperature decreases to a value of just 110 ± 20 Ω µm at 6 K, which is two to three times the minimum achievable resistance. Using a combination of experiment and theory we show that this behaviour results from carrier transport in graphene under the palladium contact. At low temperature, the carrier mean free path exceeds the palladium-graphene coupling length, leading to nearly ballistic transport with a transfer efficiency of ~75%. As the temperature increases, this carrier transport becomes less ballistic, resulting in a considerable reduction in efficiency.

814 citations

BookDOI
31 Mar 1999
TL;DR: In this paper, the authors discuss the effect of dust contamination on the performance of electrical contact devices and propose a method to prevent contact failure due to the presence of dust in the contact surfaces.
Abstract: Preface to the Second Edition Preface to the First Edition Introduction Editor Contributors Contact Interface Conduction Electrical Contact Resistance: Fundamental Principles Roland S Timsit Introduction Electrical Constriction Resistance Effect of Surface Films on Constriction and Contact Resistance Temperature of an Electrically Heated a-Spot Mechanics of a-Spot Formation Breakdown of Classical Electrical Contact Theory in Small Contact Spots Constriction Resistance at High Frequencies Summary Acknowledgements References Introduction to Contact Tarnishing and Corrosion Paul G Slade Introduction Corrosion Rates Corrosion Gases Types of Corrosion Gas Concentrations in the Atmosphere Measurements Mixed Flow Gas Laboratory Testing Electronic Connectors Power Connectors Other Considerations Acknowledgements References Gas Corrosion William H Abbott and Paul G Slade Introduction The Field Environments for Electrical Contacts Laboratory Accelerated Testing Lubrication and Inhibition of Corrosion Acknowledgement References Effect of Dust Contamination on Electrical Contacts Ji Gao Zhang Introduction Dusty Environment and Dust Composition The Characteristics of Dust Particles Application Conditions in Dusty Environment Theoretical Analysis of Connector Contact Failure due to the Dust Future Work References Nonarcing Contacts Power Connectors Milenko Braunovic Introduction Types of Power Connectors Properties of Conductor and Connector Materials Parameters Affecting Performance of Power Connections Palliative Measures Connector Degradation Prognostic Models Shape-Memory Alloys (SMA) Metal Foam Materials Installation of Power Connections Accelerated Current-Cycling Tests (Standards) References Low-Power Commercial, Automotive, and Appliance Connections Anthony Lee and George Drew Introduction Connectors Contact Terminals Degradation of Connector Contact Automotive Connector Contacts Summary References Tribology of Electronic Connectors: Contact Sliding Wear, Fretting, and Lubrication Roland S Timsit and Morton Antler Introduction Sliding Wear Fretting Lubrication References Materials, Coatings, and Platings Morton Antler and Paul G Slade Introduction Metallic Finishes Properties Related to Porosity Metallurgical and Structural Properties Physical and Mechanical Properties Acknowledgement References The Electric Arc and Switching Device Technology The Arc and Interruption Paul G Slade Introduction The Fourth State of Matter Establishing an Arc The Formation of the Electric Arc The Arc in Air at Atmospheric Pressure The Arc in Vacuum Arc Interruption Acknowledgements References The Consequences of Arcing Paul G Slade Introduction Arcing Time Arc Erosion of Electrical Contacts Blow-Off Force Contact Welding Changes in the Contact Surface as a Result of Arcing Acknowledgements References Reed Switches Kunio Hinohara Principles and Design of the Reed Switch Recommended Contact Plating Contact Surface Degradation and Countermeasures Applications of Reed Switches References Low Current and High Frequency Miniature Switches: Microelectromechanical Systems (MEMS) Metal Contact Switches Benjamin F Toler, Ronald A Coutu, Jr, and John W McBride Introduction Micro-Contact Resistance Modeling Contact Materials for Performance and Reliability Failure Modes and Reliability Conclusion References Low Current Switching John W McBride Introduction and Device Classification Device Types Design Parameters for Static Switching Contacts Mechanical Design Parameters The Measurement of Contact Wear and Contact Dynamics Electrical Characteristics of Low-Current Switching Devices at Opening Electrical Characteristics of Low-Current Switching Devices at Closure Summary Acknowledgements References Medium to High Current Switching: Low Voltage Contractors and Circuit Breakers, and Vacuum Interrupters Manfred Lindmayer General Aspects of Switching in Air Contacts for Switching in Air Low-Voltage Contactors Low-Voltage Circuit-Breakers and Miniature Circuit-Breakers Simulations of Low-Voltage Switching Devices Vacuum Interrupters References Arc Faults and Electrical Safety John J Shea Introduction Arc Fault Circuit Interrupters (AFCIs) Arcing Faults Glowing Connections Arcing Fault Properties Other Types of Arcing Faults Conclusions References Arcing Contact Materials Arcing Contact Materials Gerald J Witter Introduction Silver Metal Oxides Silver Refractory Metals Vacuum Interrupter Materials Tungsten Contacts Non-Noble Silver Alloys Silver-Nickel Contact Materials Silver Alloys and Noble Metals Silver-Graphite Contact Materials Conclusion Acknowledgements References Contact Design and Attachment Gerald J Witter and Guenther Horn Introduction Staked Contact Assembly Designs Welded Contact Assembly Designs Brazed Contact Assembly Designs Clad Metals, Inlay, and Edge Lay Contact Alloys for Non-Arcing Separable Contacts Acknowledgements References Electrical Contact Material Testing Design and Measurement Gerald J Witter and Werner Rieder Objectives Device Testing and Model Switch Testing Electrical Contact Testing Variables Electrical Testing Result Types and Measurement Methods References Arc Interactions with Contaminants Gerald J Witter and Werner Rieder Introduction Organic Contamination and Activation Mineral Particulate Contamination of Arcing Contacts Silicone Contamination of Arcing Contacts Lubricants with Refractory Fillers Oxidation of Contact Materials Resistance Effects from Long Arcs Acknowledgements References Sliding Electrical Contacts Sliding Electrical Contacts (Graphitic Type Lubrication) Kiochiro Sawa and Erle I Shobert II Introduction Mechanical Aspects Chemical Aspects Electrical Effects Thermal Effects Brush Wear Brush Materials and Abrasion Summary References Illustrative Modern Brush Applications Wilferd E Yohe and William A Nystrom Introduction Brush Materials Brush Applications Sliding Contacts for Instrumentation and Control Glenn Dorsey and Jax Glossbrenner Introduction Sliding Contact-The Micro Perspective Electrical Performance Micro-Environment of Contact Region Macro Sliding Contact Materials for Sliding Contacts Friction and Wear Characteristics Contact Parameters and Sliding-Contact Assemblies Future Summary Acknowledgements References Metal Fiber Brushes Glenn Dorsey and Doris Kuhlmann-Wilsdorf Introduction Sliding Wear of Multi-Fiber Brushes Surface Films, Friction, and Materials Properties Electrical Contact Brush Dynamics Future Summary Acknowledgements References Contact Data Useful Electric Contact Information Paul G Slade Introduction Notes to the Tables References Author Index Subject Index

758 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
2023213
2022432
2021286
2020384
2019528
2018503