Topic
Contrast transfer function
About: Contrast transfer function is a research topic. Over the lifetime, 934 publications have been published within this topic receiving 26533 citations.
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Journal Article•
TL;DR: In this article, the general expression for image displacements in electron microscopy, caused by defocus and spherical aberration, is obtained by a Fourier optics approach, and an alternative method by utilizing the Wigner distribution function is proposed.
5 citations
5 citations
Journal Article•
5 citations
TL;DR: In this paper, an alternative method to phase plate electron microscopy is described, where the range of spatial frequencies can be expanded beyond those usually obtained with the optimum underfocused image by recording a second in situ superimposed exposure further under focus.
5 citations
Patent•
11 Jul 2007
TL;DR: In this paper, the image aberration of an electron optical system is removed by shifting or inclining a beam path using the aberration α and γ of the higher order image of the outside of an axis.
Abstract: PROBLEM TO BE SOLVED: To provide a method of removing the image aberration of the axis of an electron optical system, in which the image aberration of a first, second, third, and n-th dimensional order axis are removed, and a method of removing the image aberration of the electron optical system provided with a hexapole field. SOLUTION: The image aberration of an axis is removed by shifting or inclining a beam path using the aberration α and γ of the higher order image of the outside of an axis, wherein α n is the image aberrations on the axis of the electron optical system. The first and second order image aberrations in the electron optical system provided with the hexapole field are removed by superimposing a quadrupole field or the hexapole field on the hexapole field. COPYRIGHT: (C)2008,JPO&INPIT
5 citations