scispace - formally typeset
Search or ask a question
Topic

Contrast transfer function

About: Contrast transfer function is a research topic. Over the lifetime, 934 publications have been published within this topic receiving 26533 citations.


Papers
More filters
Journal ArticleDOI
TL;DR: Two concentric, coaxial solenoids form an intermediate ring image with a cusped caustic enabling momentum selection to be made where the transverse aberration is of third order in aperture as discussed by the authors.

2 citations

Proceedings ArticleDOI
TL;DR: In this paper, the impact of spherical aberration on image quality was determined using a defined pupil function and the relationship between wavefront aberration and displacement of the best focal plane was discussed.
Abstract: Spherical aberration for intraocular lenses is calculated based on surface contributions. The impact on image quality can be determined using a defined pupil function. Relationship between wavefront aberration and displacement of the best focal plane is discussed. The impact on ANSI Z80.7 power labelling is computed and found to be as great as 0.9 Diopters for standard lens types from the combination of media conversion error and spherical aberration. A pupil function is defined for solution of the Fresnel diffraction integral, in the Fraunhofer approximation, and is used to compute strehl ratio and modulation transfer function for symmetrical biconvex, convex plano and meniscus lenses in standard atmosphere and in situ. Results in air indicate best optical performance for convex plano lenses due to minimization of spherical aberration. In situ, all lenses analyzed performed approximately equally well. Use of this calculation technique for refractive bifocal IOL performance prediction is discussed.© (1993) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

2 citations

Journal ArticleDOI
01 Aug 2010-EPL
TL;DR: In this paper, aberration-corrected high-resolution transmission electron microscopy images of a SiGe alloy grown on a silicon substrate display strong intensity variation from one atomic column to the other.
Abstract: Under specific conditions of specimen thickness and experimental settings, aberration-corrected high-resolution transmission electron microscopy images of a SiGe alloy grown on a silicon substrate display strong intensity variation from one atomic column to the other. Combining TEM image processing, semi-empirical atomic simulations of large three-dimensional structures including the SiGe/Si interface and TEM image simulations, it is demonstrated that the observed contrast is strongly correlated to the Ge content in the different atomic columns. From a theoretical point of view, this reveals new possibilities for Cs-corrected transmission electron microscopy to observe chemical contrast, and more generally opens new routes for chemical mapping in nanoalloys.

2 citations

Proceedings ArticleDOI
14 May 2017
TL;DR: In this paper, the authors investigated the focusing property of an annular-shaped beam in the presence of strong spherical aberration and found that it is robust against optical aberration.
Abstract: We experimentally investigated the focusing property of an annular-shaped beam. Apparent robustness against optical aberration was revealed when an annular-shaped beam is tightly focused in the presence of strong spherical aberration.

2 citations

Journal ArticleDOI
Nobuo Tanaka1
28 Feb 2005
TL;DR: In this paper, the development of spherical aberration correction in high-resolution electron microscopy (Cs-corrected HREM) is reviewed by focusing on TEM instruments and recent applications of the method to nano materials and interfaces are described through explaining its characteristic and the future prospects.
Abstract: Recent development of spherical aberration correction in high-resolution electron microscopy (Cs-corrected HREM) is reviewed by focusing on TEM instruments. Basis of the the previous HRTEM and new scientific elements for Cs-corrected one are summarized, and recent applications of the method to nano materials and interfaces are described through explaining its characteristic and the future prospects.

2 citations


Network Information
Related Topics (5)
Semiconductor
72.6K papers, 1.2M citations
72% related
Silicon
196K papers, 3M citations
71% related
Monolayer
47.3K papers, 1.5M citations
70% related
Thin film
275.5K papers, 4.5M citations
70% related
Chemical vapor deposition
69.7K papers, 1.3M citations
70% related
Performance
Metrics
No. of papers in the topic in previous years
YearPapers
20235
202215
20218
20209
20199
20188