Topic
Contrast transfer function
About: Contrast transfer function is a research topic. Over the lifetime, 934 publications have been published within this topic receiving 26533 citations.
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10 Feb 2011
TL;DR: In this paper, an aberration corrector is used to correct the electron beam for at least a spherical aberration in the path of an electron beam in a transmission electron microscope.
Abstract: A transmission electron microscope includes an electron beam source (20) to generate an electron beam Beam optics are provided to converge the electron beam An aberration corrector (90) corrects the electron beam for at least a spherical aberration A specimen holder is provided to hold a specimen (40) in the path of the electron beam A detector (80) is used to detect the electron beam transmitted through the specimen The transmission electron microscope operates in a dark- field mode in which a zero beam of the electron beam is not detected The microscope may also be capable of operating in an incoherent illumination mode
46 citations
TL;DR: This approach considers aberrations up to fifth order, appropriate for image formation in state-of-the-art aberration-corrected LEEM and PEEM, and calculates contrast and resolution of one-dimensional and two-dimensional pure phase, pure amplitude, and mixed phase and amplitude objects.
46 citations
TL;DR: In this paper, the authors compare the atom column intensities of silicon single crystals oriented along different crystallographic orientations with simulated high-angle annular dark field images in scanning transmission electron microscopy.
Abstract: Atom column intensities of silicon single crystals oriented along different crystallographic orientations are compared in experimental and simulated high-angle annular dark-field images in scanning transmission electron microscopy. The intensity of a background, measured between the columns, is also evaluated and found to be largely independent of the column spacing. The contrast is lower in the experiments, and it has been suggested previously that this follows because the background is higher in the experiments. We explore the extent to which the comparison of experimental atom column intensities with image simulations is aided by subtraction of the background for these data. We also explore an alternative view: simple simulations overestimate the contrast because spatial incoherence and associated instabilities are not taken into account. The results do not distinguish between these approaches, which need not be in opposition, and we describe experiments which might further clarify matters. © 2007 The American Physical Society.
46 citations
TL;DR: In this paper, a new electron optical system with three dodecapoles was developed to compensate for spherical aberration and six-fold astigmatism, which generally remains in a two-hexapole type corrector.
44 citations
TL;DR: In this article, a single-scattering theory for unfiltered and zero-loss filtered images in the electron spectroscopic imaging mode of a transmission electron microscope is presented. But the analysis is limited to the case of amorphous films.
Abstract: SUMMARY
Measured values of the transmission of amorphous films as a function of the objective aperture and film thickness can be described by a single-scattering theory for unfiltered and zero-loss filtered images in the electron spectroscopic imaging mode of a transmission electron microscope. The theory can be applied to estimate the gain of contrast by zero-loss filtering for specimen structures larger and smaller than the chromatic aberration disc.
44 citations