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Contrast transfer function
About: Contrast transfer function is a research topic. Over the lifetime, 934 publications have been published within this topic receiving 26533 citations.
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TL;DR: In this paper, the authors measured the information limit of the Philips EM420ST FEG to be 0.17 nm at 100 kV at a spatial frequency of 5 nm − 1, which is a major improvement compared to 3.1 nm −1 Scherzer resolution.
8 citations
TL;DR: A threefold symmetric line current (N3-SYLC in short) is proposed for correcting 3rd order spherical aberration of round lenses and can be realized without using magnetic materials, which makes it free of the problems of hysteresis, inhomogeneity and saturation.
7 citations
7 citations
01 Jan 2009
TL;DR: In this article, the transmission electron microscope (TEM) and related techniques, such as HRTEM, scanning transmission electron microscopy (STEM), and principles and applications in the field of electrochemical power sources are discussed.
Abstract: This article briefly describes transmission electron microscope (TEM) and related techniques, such as high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy (STEM), and principles and applications in the field of electrochemical power sources. Instrumentation and operation are discussed together on the basis of the electron scattering phenomena that generate contrast both in the real (imaging mode) and reciprocal space (diffraction mode). Applications of TEM on the study of materials in electrochemical devices are discussed, demonstrating the capability of this technique in the characterization of electrochemically active materials down to the atomic scale.
7 citations
TL;DR: A review of advances in high-resolution electron microscopy can be found in this paper, including a description of an innovation of the electron microscope, early efforts in lattice fringe imaging, developments of a cold field emission (cold-FE) electron source, high-voltage electron microscopes, realization and progress of the aberration corrector, and an aberration-corrected, 1.2-MV, highvoltage transmission electron microscope (TEM).
Abstract: Advances in high-resolution electron microscopy were reviewed in this chapter, including a description of an innovation of the electron microscope, early efforts in lattice fringe imaging, developments of a cold field emission (cold-FE) electron source, high-voltage electron microscopy, realization and progress of the aberration corrector, and an aberration-corrected, 1.2-MV, high-voltage transmission electron microscope (TEM). The last one was developed through the FIRST Tonomura Program. Its point resolution was 43 pm in TEM imaging mode. It also has a magnetic-field-free sample position, and a point resolution of 0.24 nm was obtained at that position. These capabilities offer researchers a new way to observe magnetic fields at atomic scale, which has become particularly important for the development of technologies for controlling electrons by utilizing their spins.
7 citations