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Showing papers on "Design for testing published in 1972"


Proceedings ArticleDOI
26 Jun 1972
TL;DR: In the sequence of events normally associated with the design cycle for a digital system, the two operations where simulation has the greatest impact are at opposite ends of the cycle, the Design Verification step and the Functional Test Generation step.
Abstract: In the sequence of events normally associated with the design cycle for a digital system, the two operations where simulation has the greatest impact are at opposite ends of the cycle. These are the Design Verification step and the Functional Test Generation step in Figure 1.Between Design Verification and Test Generation, the implementation, partitioning, packaging, placement, and routing operations are performed. These operations lead to a complete design, and all work from a common data base. Each step in the cycle augments the data base as the design progresses from concept to hardware.

2 citations


Journal ArticleDOI
TL;DR: This paper proposes a method of minimizing the increase in fabrication cost necessary to produce easily testable hardware.
Abstract: Digital hardware designed on lowest manufacturing cost may in the end be more expensive than the hardware designed for an acceptable manufacturing cost and a lower cost of testing. This paper proposes a method of minimizing the increase in fabrication cost necessary to produce easily testable hardware.