Showing papers on "Design for testing published in 1980"
23 Jun 1980
TL;DR: The testability analysis algorithms are reviewed and their implementation in the SCOAP program is described.
Abstract: SCOAP is a program developed at Sandia National Laboratories for the analysis of digital circuit testability. Testability is related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. This paper reviews the testability analysis algorithms and describes their implementation in the SCOAP program.
308 citations
23 Jun 1980
TL;DR: This paper is a tutorial intended primarily for individuals just getting started in digital testing, and basic concepts of testing are described, and the steps in the test development process are discussed.
Abstract: This paper is a tutorial intended primarily for individuals just getting started in digital testing. Basic concepts of testing are described, and the steps in the test development process are discussed. A pragmatic approach to test sequence generation is presented, oriented towards ICs interconnected on a board. Finally, design for testability techniques are described, with an emphasis on solving problems that appeared during the test generation discussion.
24 citations
23 Jun 1980
TL;DR: The author's opinion of the major problems confronting Design Automation for VLSI and howdesign Automation may evolve to meet these challenges are presented and possible achievable solutions are discussed.
Abstract: This paper presents the author's opinion of the major problems confronting Design Automation for VLSI and how Design Automation may evolve to meet these challenges. The paper first takes a historical look at the driving forces for Design Automation development by analyzing the evolution of Design Automation at RCA. It looks at both some successful and unsuccessful development efforts and attempts to isolate some of the criteria necessary for success. It review RCA's current LSI Design Automation capabilities and compares them to the challenge of VLSI. The major challenges -- layout, design verification and testability -- are discussed along with possible achievable solutions.
10 citations
01 Jan 1980
TL;DR: The need for testing under simulated mission operational conditions is discussed and the results of such tests are reviewed from the point of view of the user as mentioned in this paper, and a brief overview of the usal test sequences for high reliability long life spacecraft is presented and the effectiveness of the testing program is analyzed in terms of the defects discovered by such tests.
Abstract: The need for testing under simulated mission operational conditions is discussed and the results of such tests are reviewed from the point of view of the user. A brief overview of the usal test sequences for high reliability long life spacecraft is presented and the effectiveness of the testing program is analyzed in terms of the defects which are discovered by such tests. The need for automation, innovative mechanical test procedures, and design for testability is discussed.
2 citations
TL;DR: This paper focuses on the hardware design and test method as applied to the implementation of the P4 machine and the simulation and emulation aspects of the method are discussed.