Design for testing

About: Design for testing is a research topic. Over the lifetime, 3946 publications have been published within this topic receiving 63049 citations. The topic is also known as: Design for Testability, DFT.

VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips

Abstract: Scan-based DFT enhances the testability of a system by making its internal nodes more observable and controllable. However, in case of a secure chip, scan chain increases its vulnerability to attack, where the attacker can extract secret information by scanning out states of internal nodes. This paper presents VIm-Scan: a low overhead scan design methodology that maintains all the advantages of a traditional scan-based testing yet prevents secure key extraction through the scan out process. Experimental results show that the proposed approach entails significantly lesser design overhead (~5times reduction in number of additional gates) with comparable or better protection against attack than existing techniques.

Delay-fault test generation and synthesis for testability under a standard scan design methodology

Abstract: The problems of test generation and synthesis aimed at producing VLSI sequential circuits that are delay-fault testable under a standard scan design methodology are considered. Theoretical results regarding the standard scan-delay testability of finite state machines (FSMs) described at the state transition graph (STG) level are given. It is shown that a one-hot coded and optimized FSM whose STG satisfies a certain property is guaranteed to be fully gate-delay-fault testable under standard scan. This result is extended to arbitrary-length encodings, and a heuristic state assignment algorithm that results in highly gate-delay-fault testable sequential FSMs is developed. The authors also consider the problem of delay test generation for large sequential circuits and modify a PODEM-based combinational test pattern generator. The modifications involve a two-time-frame expansion of the combinational logic of the circuit and the use of backtracking heuristics tailored for the problem. A version of the scan shifting technique is also used in the test pattern generator. Test generation, flip-flop ordering, flip-flop selection and test set compaction results on large benchmark circuits are presented. >

Principles of testing electronic systems

Abstract: DESIGN AND TEST. Overview of Testing. Defects, Failures, and Faults. Design Representation. VLSI Design Flow. TEST FLOW. Role of Simulation in Testing. Automatic Test Pattern Generation. Current Testing. DESIGN FOR TESTABILITY. Ad Hoc Test Techniques. Scan-Path Design. Boundary-Scan Testing. Built-in Self-Test. SPECIAL STRUCTURES. Memory Testing. Testing FPGAs and Microprocessors. ADVANCED TOPICS. Synthesis for Testability. Testing SOCs. Appendices. Index.

Microprocessor based testing for core-based system on chip

Abstract: The purpose of this paper is to develop a flexible design for test methodology for testing a core-based system on chip (SOC). The novel feature of the approach is the use an embedded microprocessor/memory pair to test the remaining components of the SOC. Test data is downloaded using DMA techniques directly into memory while the microprocessor uses the test data to test the core. The test results are transferred to a MISR for evaluation. The approach has several important advantages over conventional ATPG such as achieving at-speed testing, not limiting the chip speed to the tester speed during test and achieving great flexibility since most of the testing process is based on software. Experimental results on an example system are discussed.

FOCUS: an experimental environment for fault sensitivity analysis

Abstract: FOCUS, a simulation environment for conducting fault-sensitivity analysis of chip-level designs, is described. The environment can be used to evaluate alternative design tactics at an early design stage. A range of user specified faults is automatically injected at runtime, and their propagation to the chip I/O pins is measured through the gate and higher levels. A number of techniques for fault-sensitivity analysis are proposed and implemented in the FOCUS environment. These include transient impact assessment on latch, pin and functional errors, external pin error distribution due to in-chip transients, charge-level sensitivity analysis, and error propagation models to depict the dynamic behavior of latch errors. A case study of the impact of transient faults on microprocessor-based jet-engine controller is used to identify the critical fault propagation paths, the module most sensitive to fault propagation, and the module with the highest potential for causing external errors. >