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Differential nonlinearity

About: Differential nonlinearity is a research topic. Over the lifetime, 1020 publications have been published within this topic receiving 18227 citations.


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Journal ArticleDOI
TL;DR: In this paper, a 1.5-V, 10-bit, 14.3-MS/s pipeline analog-to-digital converter was implemented in a 0.6/spl mu/m CMOS technology.
Abstract: A 1.5-V, 10-bit, 14.3-MS/s pipeline analog-to-digital converter was implemented in a 0.6 /spl mu/m CMOS technology. Emphasis was placed on observing device reliability constraints at low voltage. MOS switches were implemented without low-threshold devices by using a bootstrapping technique that does not subject the devices to large terminal voltages. The converter achieved a peak signal-to-noise-and-distortion ratio of 58.5 dB, maximum differential nonlinearity of 11.5 least significant bit (LSB), maximum integral nonlinearity of 0.7 LSB, and a power consumption of 36 mW.

966 citations

Journal ArticleDOI
TL;DR: A new coarse-fine TDC architecture is proposed by using an array of time amplifiers and two identical fine TDCs that compensate for the variation of the TA gain during the conversion process, which will improve the linearity further.
Abstract: This paper presents the design of a coarse-fine time-to-digital converter (TDC) that amplifies a time residue to improve time resolution, similar to a coarse-fine analog-to-digital converter (ADC). A new digital circuit has been developed to amplify the time residue with a higher gain (>16) and larger range (>80 ps) than existing solutions do. However, adapting the conventional coarse-fine architecture from ADCs is not an appropriate solution for TDCs: input time cannot be stored, and the gain of a time amplifier (TA) cannot be controlled precisely. This paper proposes a new coarse-fine TDC architecture by using an array of time amplifiers and two identical fine TDCs that compensate for the variation of the TA gain during the conversion process. The measured DNL and INL are plusmn0.8 LSB and plusmn3 LSB, respectively, with a value of 1.25 ps per 1 LSB, while the standard deviation of output code for constant inputs remains below 1 LSB across the TDC range. Although the nonlinearity is larger than 1 LSB, using an INL lookup table or better matched delays in the coarse TDC delay chain will improve the linearity further.

465 citations

Journal ArticleDOI
Chi-Hung Lin1, Klaas Bult1
TL;DR: In this paper, a 10-b current steering CMOS digital-to-analog converter (DAC) with optimized performance for frequency domain applications is described, where the spurious free dynamic range (SFDR) is better than 60 dB for signals from DC to Nyquist.
Abstract: A 10-b current steering CMOS digital-to-analog converter (DAC) is described, with optimized performance for frequency domain applications. For sampling frequencies up to 200 MSample/s, the spurious free dynamic range (SFDR) is better than 60 dB for signals from DC to Nyquist. For sampling frequencies up to 400 MSample/s, the SFDR is better than 55 dB for signals from DC to Nyquist. The measured differential nonlinearity and integral nonlinearity are 0.1 least significant bit (LSB) and 0.2 LSB, respectively. The circuit is fabricated in a 0.35-/spl mu/m, single-poly, four-metal, 3.3 V, standard digital CMOS process and occupies 0.6 mm/sup 2/. When operating at 500 MSample/s, it dissipates 125 mW from a 3.3 V power supply. This DAC is optimized for embedded applications with large amounts of digital circuitry.

389 citations

Journal ArticleDOI
TL;DR: In this paper, a 10-bit 1-GSample/s current-steering CMOS digital-to-analog (D/A) converter is presented, where the measured integral nonlinearity is better than /spl plusmn/0.2 LSB.
Abstract: In this paper, a 10-bit 1-GSample/s current-steering CMOS digital-to-analog (D/A) converter is presented. The measured integral nonlinearity is better than /spl plusmn/0.2 LSB and the measured differential nonlinearity lies between -0.08 and 0.14 LSB proving the 10-bit accuracy. The 1-GSample/s conversion rate has been obtained by an, at transistor level, fully custom-designed thermometer decoder and synchronization circuit. The layout has been carefully optimized. The parasitic interconnect loads have been estimated and have been iterated in the circuit design. A spurious-free dynamic range (SFDR) of more than 61 dB has been measured in the interval from dc to Nyquist. The power consumption equals 110 mW for a near-Nyquist sinusoidal output signal at a 1-GHz clock. The chip has been processed in a standard 0.35-/spl mu/m CMOS technology and has an active area of only 0.35 mm/sup 2/.

379 citations

Journal ArticleDOI
TL;DR: In this article, a 12-bit intrinsic accuracy digital-to-analog (D/A) converter integrated in a standard digital 0.5 /spl mu/m CMOS technology is presented.
Abstract: A 12-bit intrinsic accuracy digital-to-analog (D/A) converter integrated in a standard digital 0.5 /spl mu/m CMOS technology is presented. It is based on a current steering doubly segmented 6+2+4 architecture and requires no calibration, no trimming, or dynamic averaging. The differential nonlinearity (DNL) and integral nonlinearity (INL) are 0.3 and 0.6 least significant bits (LSB's), respectively. The measured glitch energy is 1.9 pV.s. For a 12-bit resolution, the converter reaches an update rate of 300 MS/s. By reducing the voltage supply of the latches to 2.0 V, the glitch energy is reduced to sub-pV.s, and the update rate reaches 500 MS/s, for a resolution of 8 bits. The worst case power consumption is 320 mW, and it operates from a single 3.3 V voltage supply. The die area is 3.2 mm/sup 2/.

349 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202326
202249
202126
202040
201930
201839