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Digital electronics

About: Digital electronics is a research topic. Over the lifetime, 10354 publications have been published within this topic receiving 153532 citations.


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Journal ArticleDOI
TL;DR: It is shown that the flip-flop approach is equivalent to an infinitely long chain with respect to the worst-case static noise margin of logic circuits, and the formal equivalence of four criteria for this worst- Case Static noise margin is demonstrated.
Abstract: Various criteria have been formulated in the past for analytically calculating the worst-case static noise margins of logic circuits. Some of these criteria are based on infinitely long chains of gates, others on flip-flop circuits. It is shown that the flip-flop approach is equivalent to an infinitely long chain with respect to the worst-case static noise margin. Furthermore, the formal equivalence of four criteria for this worst-case static noise margin is demonstrated. Additionally, a method for computer simulation is discussed.

218 citations

Journal ArticleDOI
TL;DR: In this paper, resonant-tunneling bipolar transistors (RTBTs) with a double barrier in the base region are described, and the first observation of minority-electron ballistic RT is presented.
Abstract: Recent advances in the area of quantum functional devices are discussed. After a discussion of the functional device concept, resonant-tunneling bipolar transistors (RTBTs) with a double barrier in the base region are described. Design considerations for RTBTs with ballistic injection and the first observation of minority-electron ballistic RT are presented. RTBTs using thermionic injection and exhibiting a high peak-to-valley ratio at room temperature in the transfer characteristics are also described. Multiple-state RTBTs and their DC and microwave performance are then discussed. Circuit applications of RTBTs also are discussed. It is shown that RTBTs allow the implementation of many analog and digital circuit functions with a greatly reduced number of transistors and show considerable promise for multiple-valued logic. Experimental results on frequency multipliers and parity bit generators are presented. Analog-to-digital converters are memory circuits are also discussed. Two novel superlattice-base transistors are reported. Negative transconductance is achieved by suppression of injection into minibands. Gated quantum-well RT transistors are also discussed. >

214 citations

Journal ArticleDOI
TL;DR: What is presented is a new and uniform conceptual framework for a wide range of CAD problems including, but not limited to, test pattern generation, design verification, as well as logic optimization problems.
Abstract: Motivated by the problem of test pattern generation in digital circuits, this paper presents a novel technique called recursive learning that is able to perform a logic analysis on digital circuits. By recursively calling certain learning functions, it is possible to extract all logic dependencies between signals in a circuit and to perform precise implications for a given set of value assignments. This is of fundamental importance because it represents a new solution to the Boolean satisfiability problem. Thus, what we present is a new and uniform conceptual framework for a wide range of CAD problems including, but not limited to, test pattern generation, design verification, as well as logic optimization problems. Previous test generators for combinational and sequential circuits use a decision tree to systematically explore the search space when trying to generate a test vector. Recursive learning represents an attractive alternative. Using recursive learning with sufficient depth of recursion during the test generation process guarantees that implications are performed precisely; i.e., all necessary assignments for fault detection are identified at every stage of the algorithm so that no backtracks can occur. Consequently, no decision tree is needed to guarantee the completeness of the test generation algorithm. Recursive learning is not restricted to a particular logic alphabet and can be combined with most test generators for combinational and sequential circuits. Experimental results that demonstrate the efficiency of recursive learning are compared with the conventional branch-and-bound technique for test generation in combinational circuits. In particular, redundancy identification by recursive learning is demonstrated to be much more efficient than by previously reported techniques. In an important recent development, recursive learning has been shown to provide significant progress in design verification problems. Also importantly, recursive learning-based techniques have already been shown to be useful for logic optimization. Specifically, techniques based on recursive learning have already yielded better optimized circuits than the well known MIS-II. >

214 citations

Journal ArticleDOI
TL;DR: A technique is proposed for optimizing a sequential network by moving all the registers to the periphery of a network using an extension of retiming, resynthesizing the combinational logic between the registers using existing logic minimization techniques, and replacing the registers throughout the network using retimed algorithms.
Abstract: Sequential networks contain combinational logic blocks separated by registers. Application of combinational logic minimization techniques to the separate logic block results in improvement that is restricted by the placement of the registers; information about logical dependencies between blocks separated by registers is not utilized. Temporarily moving all the registers to the periphery of a network provides the combinational logic minimization tools with a global view of the logic. A technique is proposed for optimizing a sequential network by moving the registers to the boundary of the network using an extension of retiming, resynthesizing the combinational logic between the registers using existing logic minimization techniques, and replacing the registers throughout the network using retiming algorithms. >

211 citations

Book
23 Jul 1998
TL;DR: In this article, the authors introduce electric circuits and components, including sensors, actuators, and digital circuits, and present a case study of an analog signal processing using operational amplifiers.
Abstract: 1 Introduction 2 Electric Circuits and Components 3 Semiconductor Electronics 4 System Response 5 Analog Signal Processing Using Operational Amplifiers 6 Digital Circuits 7 Microcontroller Programming and Interfacing 8 Data Acquisition 9 Sensors 10 Actuators 11 Mechatronic Systems-Control Architectures and Case Studies Appendixes A Measurement Fundamentals B Physical Principles C Mechanics of Materials

211 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202369
2022156
2021171
2020255
2019255
2018250