Topic
Digital electronics
About: Digital electronics is a research topic. Over the lifetime, 10354 publications have been published within this topic receiving 153532 citations.
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13 Jan 2010
TL;DR: This paper is intended as a tutorial on how to use memristor crossbars for logic design and is a consolidation of various recent publications.
Abstract: A memristor is a passive electronic device that was proposed and described by Leon Chua in 1971. The first practical implementation has been realized by Stan Williams’ group at HP Labs in 2008. The goal of this paper is to give the reader a brief introduction to the possibilities of logic design using memristors. It paper is intended as a tutorial on how to use memristor crossbars for logic design and is a consolidation of various recent publications.
37 citations
TL;DR: In this article, a mixed analog-digital IC combining the speech and signaling functions of an analog telephone is described, which offers the possibility of integrating complex digital functions, such as dual-tone multifrequency (DTMF) generation, in combination with many digital programmable analog circuits.
Abstract: A mixed analog-digital IC combining the speech and signaling functions of an analog telephone is described. The realization in a standard 2- mu m CMOS process offers the possibility of integrating complex digital functions, such as dual-tone multifrequency (DTMF) generation, in combination with many digital programmable analog circuits . Novel features, such as digital programmable level control, DC characteristics, frequency response, input impedance, and sidetone path, are implemented. These attributes offer a flexible solution for the different international requirements, with only a few external components. Software control of analog and digital functions and the high degree of integration enable telephone manufacturers to produce a quality feature phone with a minimum of components, and therefore with high reliability and low cost. >
37 citations
Book•
01 Jan 2003
TL;DR: The paper presents a meta-modelling framework for designing digital system design in practice and some practical examples show the need for this framework to be applied in the rapidly changing environment.
Abstract: Table of contents
Part 1: Digital FundamentalsChapter 1: Digital LogicChapter 2: Integrated Circuits and the 7400 Logic FamiliesChapter 3: Basic Computer ArchitectureChapter 4: MemoryChapter 5: Serial CommunicationsChapter 6: Basic Microproprocessors and Microcomputer ElementsPart 2: Advanced Digital SystemsChapter 7: Advanced Microprocessor ConceptsChapter 8: High-Performance Memory TechnologiesChapter 9: NetworkingChapter 10: Logic Design and Finite State MadchinesChapter 11: Programmable Logic DevicesPart 3: Analog Basics for Digital SystemsChapter 12: Electrical FundamentalsChapter 13: Diodes and TransistorsChapter 14: Oerational AmplifiersChapter 15: Analog Interfaces for Digital SystemsPart 4: Digital System Design in PracticeChapter 16: Clock DistributionChapter 17: Voltage Regulation and Power DistributionChapter 18: Signal IntegrityChapter 19: Designing for SuccessAppendix A: Further EducationIndex
37 citations
06 Mar 1995
TL;DR: A defect-oriented test methodology for mixed analog-digital circuits is proposed, shown that with simple tests 93% of the defects in this circuit can be detected and application of DfT guidelines derived from this test methodology may improve the defect coverage to 99%.
Abstract: Testing of analog blocks in digital circuits is emerging as a critical factor in the success of mixed-signal ICs. The present specification-oriented testing of these blocks results in high test costs and doesn't ensure detection of all defects, causing potential reliability problems. To solve these problems, in this paper a defect-oriented test methodology for mixed analog-digital circuits is proposed. The strength of the method is demonstrated by an implementation for a complex mixed-signal circuit, a flash analog-to-digital converter. It is shown that with simple tests 93% of the defects in this circuit can be detected. Moreover application of DfT guidelines derived from this test methodology may improve the defect coverage to 99%. First impressions lead to the conclusion that the analyzed test obtains a higher defect coverage with lower test costs than functional tests. >
37 citations