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Digital electronics

About: Digital electronics is a research topic. Over the lifetime, 10354 publications have been published within this topic receiving 153532 citations.


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Journal ArticleDOI
TL;DR: A pattern-independent, linear time algorithm (iMax) that estimates at every contact point, an upper bound envelope of all possible current waveforms that result by the application of different input patterns to the circuit is proposed.
Abstract: Currents flowing in the power and ground (P&G) buses of CMOS digital circuits affect both circuit reliability and performance by causing excessive voltage drops. Excessive voltage drops manifest themselves as glitches on the P&G buses and cause erroneous logic signals and degradation in switching speeds. Maximum current estimates are needed at every contact point in the buses to study the severity of the voltage drop problems and to redesign the supply lines accordingly. These currents, however, depend on the specific input patterns that are applied to the circuit. Since it is prohibitively expensive to enumerate all possible input patterns, this problem has, for a long time, remained largely unsolved. In this paper, we propose a pattern-independent, linear time algorithm (iMax) that estimates at every contact point, an upper bound envelope of all possible current waveforms that result by the application of different input patterns to the circuit. The algorithm is extremely efficient and produces good results for most circuits as is demonstrated by experimental results on several benchmark circuits. The accuracy of the algorithm can be further improved by resolving the signal correlations that exist inside a circuit. We also present a novel partial input enumeration (PIE) technique to resolve signal correlations and significantly improve the upper bounds for circuits where the bounds produced by iMax are not tight. We establish with extensive experimental results that these algorithms represent a good time-accuracy trade-off and are applicable to VLSI circuits. >

156 citations

Proceedings ArticleDOI
02 May 2010
TL;DR: In this article, the layout design through error-aware transistor positioning (LEAP) principle was applied to the dual-interlocked storage cell (DICE) and a new sequential element called LEAP-DICE was designed.
Abstract: This paper presents a new layout design principle called LEAP which is an acronym for Layout Design through Error-Aware Transistor Positioning. This principle extends beyond traditional layout techniques, such as node separation, and significantly improves the soft error resilience of digital circuits with negligible performance cost. In this study, we applied the LEAP technique to the Dual Interlocked Storage Cell (DICE) and designed a new sequential element called LEAP-DICE. This element retains the circuit topology and transistor sizing of DICE but has a new layout based on the LEAP principle. Radiation experiments using an 180nm CMOS test chip demonstrate that our LEAP-DICE flip-flop encounters 5X fewer errors on average compared to our reference DICE flip-flop, and 2,000X fewer errors on average compared to a conventional D-flip-flop. Our LEAP-DICE flip-flop imposes negligible power and delay costs and 40% flip-flop-level area costs compared to our reference DICE flip-flop.

155 citations

Book
Hubert Kaeslin1
28 Apr 2008
TL;DR: This comprehensive guide to how and when to design VLSI circuits, covers the advances, challenges and past mistakes in design, acting as an introduction to graduate students and a reference for practising electronic engineers.
Abstract: VLSI circuits are ubiquitous in the modern world, and designing them efficiently is becoming increasingly challenging with the development of ever smaller chips. This practically oriented textbook covers the important aspects of VLSI design using a top-down approach, reflecting the way digital circuits are actually designed. Using practical hints and tips, case studies and checklists, this comprehensive guide to how and when to design VLSI circuits, covers the advances, challenges and past mistakes in design, acting as an introduction to graduate students and a reference for practising electronic engineers.

155 citations

Journal ArticleDOI
TL;DR: The paper presents an evolutionary approach to the design of fault-tolerant VLSI (very large scale integrated) circuits using EHW (evolvable hardware), and compares two methods to achieve fault-Tolerant design, one based on fitness definition and the other based on population.
Abstract: The paper presents an evolutionary approach to the design of fault-tolerant VLSI (very large scale integrated) circuits using EHW (evolvable hardware). The EHW research area comprises a set of applications where GA (genetic algorithms) are used for the automatic synthesis and adaptation of electronic circuits. EHW is particularly suitable for applications requiring changes in task requirements and in the environment or faults, through its ability to reconfigure the hardware structure dynamically and autonomously. This capacity for adaptation is achieved via the use of GA search techniques, in our experiments, a fine-grained CMOS (complementary metal-oxide silicon) FPTA (field-programmable FPGA transistor array) architecture is used to synthesize electronic circuits. The FPTA is a reconfigurable architecture, programmable at the transistor level and specifically designed for EHW applications. The paper demonstrates the power of EA to design analog and digital fault-tolerant circuits. It compares two methods to achieve fault-tolerant design, one based on fitness definition and the other based on population. The fitness approach defines, explicitly, the faults that the component can encounter during its life, and evaluates the average behavior of the individuals. The population approach, on the other hand, uses the implicit information of the population statistics accumulated by the GA over many generations. The paper presents experiment results obtained using both approaches for the synthesis of a fault-tolerant digital circuit (XNOR) and a fault-tolerant analog circuit (multiplier).

153 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202369
2022156
2021171
2020255
2019255
2018250