Digital-to-analog converter

About: Digital-to-analog converter is a research topic. Over the lifetime, 4498 publications have been published within this topic receiving 39743 citations. The topic is also known as: DAC.

A 10-b, 500-MSample/s CMOS DAC in 0.6 mm/sup 2/

Abstract: A 10-b current steering CMOS digital-to-analog converter (DAC) is described, with optimized performance for frequency domain applications. For sampling frequencies up to 200 MSample/s, the spurious free dynamic range (SFDR) is better than 60 dB for signals from DC to Nyquist. For sampling frequencies up to 400 MSample/s, the SFDR is better than 55 dB for signals from DC to Nyquist. The measured differential nonlinearity and integral nonlinearity are 0.1 least significant bit (LSB) and 0.2 LSB, respectively. The circuit is fabricated in a 0.35-/spl mu/m, single-poly, four-metal, 3.3 V, standard digital CMOS process and occupies 0.6 mm/sup 2/. When operating at 500 MSample/s, it dissipates 125 mW from a 3.3 V power supply. This DAC is optimized for embedded applications with large amounts of digital circuitry.

A 12-bit intrinsic accuracy high-speed CMOS DAC

Abstract: A 12-bit intrinsic accuracy digital-to-analog (D/A) converter integrated in a standard digital 0.5 /spl mu/m CMOS technology is presented. It is based on a current steering doubly segmented 6+2+4 architecture and requires no calibration, no trimming, or dynamic averaging. The differential nonlinearity (DNL) and integral nonlinearity (INL) are 0.3 and 0.6 least significant bits (LSB's), respectively. The measured glitch energy is 1.9 pV.s. For a 12-bit resolution, the converter reaches an update rate of 300 MS/s. By reducing the voltage supply of the latches to 2.0 V, the glitch energy is reduced to sub-pV.s, and the update rate reaches 500 MS/s, for a resolution of 8 bits. The worst case power consumption is 320 mW, and it operates from a single 3.3 V voltage supply. The die area is 3.2 mm/sup 2/.

Digital to analog converter

Abstract: A segmented DAC is described in which the outputs of a pair of subword DAC circuits are summed by modulating the offset voltage of a differential buffer amplifier. Also described are various alternative DAC embodiments and an operational amplifier input stage in which modulation of the offset voltage of a differential amplifier responsive to a digital signal is accomplished using interpolation techniques for eliminating errors in linearity and monotonicity arising from component inaccuracies.

A 12-bit 80-MSample/s pipelined ADC with bootstrapped digital calibration

Abstract: This paper presents a prototype analog-to-digital converter (ADC) that uses a calibration algorithm to adaptively overcome constant closed-loop gain errors, closed-loop gain variation, and slew-rate limiting. The prototype consists of an input sample-and-hold amplifier (SHA) that can serve as a calibration queue, a 12-bit 80-MSample/s pipelined ADC, a digital-to-analog converter (DAC) for calibration, and an embedded custom microprocessor, which carries out the calibration algorithm. The calibration is bootstrapped in the sense that the DAC is used to calibrate the ADC, and the ADC is used to calibrate the DAC. With foreground calibration, test results show that the peak differential nonlinearity (DNL) is -0.09 least significant bits (LSB), and the peak integral nonlinearity (INL) is -0.24LSB. Also, the maximum signal-to-noise-and-distortion ratio (SNDR) and spurious-free dynamic range (SFDR) are 71.0 and 79.6dB with a 40-MHz sinusoidal input, respectively. The prototype occupies 22.6 mm/sup 2/ in a 0.25-/spl mu/m CMOS technology and dissipates 755 mW from a 2.5-V supply.