Electrical impedance

About: Electrical impedance is a research topic. Over the lifetime, 36015 publications have been published within this topic receiving 371891 citations. The topic is also known as: electrical impedance & complex impedance.

Microfluidic device for cell capture and impedance measurement

Abstract: This work presents a microfluidic device to capture physically single cells within microstructures inside a channel and to measure the impedance of a single HeLa cell (human cervical epithelioid carcinoma) using impedance spectroscopy. The device includes a glass substrate with electrodes and a PDMS channel with micro pillars. The commercial software CFD–ACE+ is used to study the flow of the microstructures in the channel. According to simulation results, the probability of cell capture by three micro pillars is about 10%. An equivalent circuit model of the device is established and fits closely to the experimental results. The circuit can be modeled electrically as cell impedance in parallel with dielectric capacitance and in series with a pair of electrode resistors. The system is operated at low frequency between 1 and 100 kHz. In this study, experiments show that the HeLa cell is successfully captured by the micro pillars and its impedance is measured by impedance spectroscopy. The magnitude of the HeLa cell impedance declines at all operation voltages with frequency because the HeLa cell is capacitive. Additionally, increasing the operation voltage reduces the magnitude of the HeLa cell because a strong electric field may promote the exchange of ions between the cytoplasm and the isotonic solution. Below an operating voltage of 0.9 V, the system impedance response is characteristic of a parallel circuit at under 30 kHz and of a series circuit at between 30 and 100 kHz. The phase of the HeLa cell impedance is characteristic of a series circuit when the operation voltage exceeds 0.8 V because the cell impedance becomes significant.

Analytic modeling, simulation and interpretation of broadband beam coupling impedance bench measurements

Abstract: First, a generalized theoretical approach towards beam coupling impedances and stretched-wire measurements is introduced. Applied to a circular symmetric setup, this approach allows to compare beam and wire impedances. The conversion formulas for TEM scattering parameters from measurements to impedances are thoroughly analyzed and compared to the analytical beam impedance solution. A proof of validity for the distributed impedance formula is given. The interaction of the beam or the TEM wave with dispersive material such as ferrite is discussed. The dependence of the obtained beam impedance on the relativistic velocity β is investigated and found as material property dependent. Second, numerical simulations of wakefields and scattering parameters are compared. The applicability of scattering parameter conversion formulas for finite device length is investigated. Laboratory measurement results for a circularly symmetric test setup, i.e. a ferrite ring, are shown and compared to analytic and numeric models. The optimization of the measurement process and error reduction strategies are discussed.

Accurate fault impedance locating algorithm

Abstract: Fault resistances affect the accuracy of short-circuit location, when distance to the fault is determined by means of measuring reactance at one end of the transmission line. This is because the current which flows through the fault resistance is slightly shifted in phase with respect to the current measured at the end of the line in question, due to the effect of the prefault load current. As a result, the fault resistance is recognised as an apparent impedance with both resistive and reactive components. The latter produces an error in the fault location, as it affects the measured reactance. The paper presents a simple algorithm which compensates for the error, and makes it possible to locate short circuits accurately; even if fault resistances are comparatively high.