Electron backscatter diffraction

About: Electron backscatter diffraction is a research topic. Over the lifetime, 15184 publications have been published within this topic receiving 317847 citations. The topic is also known as: EBSD.

Defect and Microstructure Analysis by Diffraction

Abstract: Introduction to Defect and Microstructure Analysis or the Analysis of Real-Structure Some Applications of the Kinematical Theory of X-ray Diffraction Profile Fitting and Analytical Functions Effects of Instrument Function, Crystallite Size, and Strain on Reflection Profiles Use of Pattern Decomposition or Simulation to Study Microstructure: theoretical considerations Classical Treatment of Line Profiles Influenced by Strain, Small Size, and Stacking Faults Voigt-Function Model in Diffraction Line-Broadening Analysis X-Ray Analysis of Precipitation Related Crystals with Dislocation Substructure The Dislocation Based Model of Strain Broadening in X-Ray Line-Profile Analysis Diffraction-Line Broadening Analysis of Dislocation Configurations Diffraction-Line Broadening Analysis of Strain Fields in Crystalline Solids Paracrystallinity The Model of the Paracrystal and its Application to Polymers Effect of Planar Defects in Crystal on the Position and Profile of Powder Diffraction Line Effect of Stacking Disorder on the Profile of the Powder Diffraction Line Crystallite Statistics and Accuracy in Powder Diffraction Intensity Measurements Reciprocal Space Mapping and Ultra-High Resolution Diffraction of Polycrystalline Materials X-Ray Analysis of The Inhomogeneous Stress State Texture Analysis Texture Effects in Powder Diffraction and their Correction by Simple Empirical Functions Accounting For Size and Microstrain in Whole Powder Pattern Fitting Modelling of Texture in Whole Pattern Fitting A New Whole Powder Pattern Fitting Approach The Role of Whole-Pattern Databases in Materials Science Restoration and Preprocessing of Physical Profiles from Measured Data Towards Higher Resolution: A Mathematical Approach Use of Pattern Decomposition to Study Microstructure: Practical Aspects and Applications X-Ray Diffraction Broadening Effects in Materials Characterization Crystal Size and Distortion Parameters in Fibres using WAXS Pressure Induced Profile Change of Energy Dispersive Diffraction

Raman Scattering Study of the Crystallization and Phase Transformations of ZrO2

Abstract: X-ray diffraction, electron diffraction, and Raman scattering measurements are presented for dehydrated amorphous ZrO2. Although the material lacks sufficient crystallinity to diffract X rays, electron diffraction patterns indicate a microcrystallinity with a grain size of 15 to 30 A. Raman spectra characteristic of the metastable tetragonal polymorph were obtained from these materials. Heating the amorphous materials induces recrystallization into first a metastable tetragonal phase and then the stable monoclinic phase.

X-Ray Diffraction: Instrumentation and Applications

Abstract: X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials. It provides information on structures, phases, preferred crystal orientations (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays scattered at specific angles from each set of lattice planes in a sample. The peak intensities are determined by the distribution of atoms within the lattice. Consequently, the X-ray diffraction pattern is the fingerprint of periodic atomic arrangements in a given material. This review summarizes the scientific trends associated with the rapid development of the technique of X-ray diffraction over the past five years pertaining to the fields of pharmaceuticals, forensic science, geological applications, microelectronics, and glass manufacturing, as well as in corrosion analysis.