Topic
Electron backscatter diffraction
About: Electron backscatter diffraction is a research topic. Over the lifetime, 15184 publications have been published within this topic receiving 317847 citations. The topic is also known as: EBSD.
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TL;DR: In this article, a three-point bending test was performed at room temperature on Mg-Al-Zn sheet material (∼8.0μm initial grain size) and optical microscopy examinations revealed a highly localized twinning pattern during bending.
81 citations
81 citations
TL;DR: In this article, the deformation modes and microstructure evolution of the extruded Mg-3.0Y alloy during the tensile test at room temperature were investigated to explore the reasons for the high ductility by transmission electron microscopy and electron backscattered diffraction (EBSD).
81 citations
81 citations
TL;DR: A focused ion beam (FIB) instrument has been used to mill surfaces in singlecrystal Si and single-crystal Cu for subsequent electron backscattering diffraction (EBSD) analysis as discussed by the authors.
Abstract: A focused ion beam (FIB) instrument has been used to mill surfaces in single-crystal Si and single-crystal Cu for subsequent electron backscattering diffraction (EBSD) analysis. The FIB cuts were performed using a 30 keV and a 5 keV Ga+ ion beam at a stage tilt of 20° to provide a readily obtainable 70° surface for direct EBSD investigation in a scanning electron microscope (SEM). The quality of the patterns is related to the amount of FIB damage induced in the Cu and Si. These or similar methods should be directly transferable to a FIB/SEM dual beam instrument equipped with an EBSD detector.
81 citations