Topic
Electron backscatter diffraction
About: Electron backscatter diffraction is a research topic. Over the lifetime, 15184 publications have been published within this topic receiving 317847 citations. The topic is also known as: EBSD.
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TL;DR: In this paper, the overall defects in LaMnO3+δ have been studied by powder neutron diffraction, electron diffraction and high resolution transmission electron microscopy on a sample with the formal composition LaO3.
311 citations
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TL;DR: In this article, optical microscopy, electron backscatter diffraction and X-ray diffraction are employed to characterize the microstructures and textures of as-rolled and annealed Mg-1Zn and Mg−1ZN-xCe.
309 citations
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15 Nov 2001-Materials Science and Engineering A-structural Materials Properties Microstructure and Processing
TL;DR: In this paper, the microstructure and fatigue properties of three model AS7G03 cast aluminium alloys containing artificial pore have been studied by using Synchrotron X-ray tomography.
Abstract: The microstructure and fatigue properties of three model AS7G03 cast aluminium alloys containing artificial pores have been studied. Synchrotron X-ray tomography has been used to characterise in three dimensions the pore population in the alloys. The development of fatigue cracks in relation with local crystallography has been studied by means of electron back scattered diffraction (EBSD). Both the average number of cycles to failure and the lifetime scatter depend on the pore content specially at high stress level. The mechanism leading to the initiation of a crack from a pore has been identified. The crack propagation at high stress level appears to be quite insensitive to microstructural barriers and can be reasonably well described by a Paris type law. At low stresses, however, short cracks are often observed to be stopped at grain boundaries and the fatigue life is no longer predicted by a simple propagation law.
308 citations
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TL;DR: In this article, the advantages and limitations of the EBSD technique are discussed and compared with a field emission gun scanning electron microscope (EEM) in conjunction with a grain structure > 0.1 μm.
308 citations