Topic
Electron backscatter diffraction
About: Electron backscatter diffraction is a research topic. Over the lifetime, 15184 publications have been published within this topic receiving 317847 citations. The topic is also known as: EBSD.
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TL;DR: In this article, the microstructure of the as-fabricated samples was investigated using X-ray diffraction technique, secondary electron microscopy and electron backscatter diffraction and the mechanical properties evaluated through micro-hardness and wear resistance measurements together with nano-indentation.
74 citations
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TL;DR: In this paper, a quasi-in-situ electron backscatter diffraction method is used for the first time to monitor the texture evolution during the cold rolling process of Mg sheet alloys.
74 citations
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TL;DR: In this article, a single rolling pass of the accumulated roll bonding process in which a Cu/Nb layered composite with an initial average layer thickness of 24μm subjected to a 50% height reduction is examined.
74 citations
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TL;DR: The improvement during the last 5 to 10 years in the design of X-ray diffraction equipment gives us an opportunity to re-examine the concepts of the structure of calcified tissues and theructure of the apatites, as well as the results obtained by the various investigators.
Abstract: The improvement during the last 5 to 10 years in the design of X-ray diffraction equipment gives us an opportunity to re-examine our concepts of the structure of calcified tissues and the structure of the apatites. The microbeam techniques now permit the study of the crystal species and crystal orientation in tissue sections on areas as small as 30 microns.‘ Further reduction of the area is possible, but entails considerable inconveniences. When accompanied by a corresponding reduction in the thickness of the section, then the amount of diffracting matter which is irradiated by the beam is so small that the exposure times are prolonged to several hundred hours. The microfocus X-ray diffraction tubes of high brilliance can reduce the exposure times by a factor of 50. The new Geiger counter X-ray diffractometer, with its higher precision in the measurement of the reflection angles and the higher sensitivity in the detection of weak reflections, is essential in the study of the chemical composition of the apatites. The only crystal species found in the mineralized tissues of vertebrates, i.e., in enamel, dentin, cementum, and bone, is an apatite. In spit.e of pressing the search to the finest details, no reflection has been found on the diffractograms indicating the presence of another crystalline compound. Naturally, for the X-ray diffraction studies, dental enamel has been chiefly used, since its apatite is much better crystallized than the apatite of bone. In human incisor enamel, usually two fiber structures are observed intersecting at angles up to 60’. In shark’s enamel they intersect a t right angles? The physical properties of the enamels are conditioned by this orientation. The factors directing the orientation must be found in the organic matrix. The diffractograms of dentin, cementum, and bone usually do not reveal such an orientation, as the individual protein fibers of the matrix are oriented in many directions. However, if special small areas are selected in which histological methods have shown a parallel orientation of the protein fibers, then X-ray examination will also reveal the preferred orientation of the apatite. In certain special varieties of cementum and bone, a high degree of parallel orientation of the apatite crystallites has been observed. The size of the crystallites is estimated from broadening of the diffraction lines. Thus, in human incisor enamel and in bone, one finds an average size of 600 and 200 A.,3 respectively, or of 870 and 290 A? The difference in the results obtained by the various investigators is chiefly due to differences in the The crystallites in the tissues are oriented, forming “fiber” structures,
74 citations
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TL;DR: Precession electron diffraction (PED) as mentioned in this paper is a new promising technique for X-ray diffraction pattern collection under quasi-kinematical conditions, which enables "ab-initio" solving of crystalline structures of nanocrystals.
Abstract: Precession electron diffraction (PED) is a new promising technique for electron diffraction pattern collection under quasi-kinematical conditions (as in X-ray Diffraction), which enables "ab-initio" solving of crystalline structures of nanocrystals. The PED technique may be used in TEM instruments of voltages 100 to 400 kV and is an effective upgrade of the TEM instrument to a true electron diffractometer. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscattered Diffraction (EBSD) technique in Scanning Electron Microscopes (SEM) at lower magnifications and longer acquisition times.
74 citations