Electron backscatter diffraction

About: Electron backscatter diffraction is a research topic. Over the lifetime, 15184 publications have been published within this topic receiving 317847 citations. The topic is also known as: EBSD.

The evolution of annealing textures in 90 Pct drawn copper wire

Abstract: An electrolytic copper rod was drawn in 24 passes to a 90 pct reduction in area and subsequently annealed under various conditions. The global texture of the drawn wire, as measured by X-ray methods, showed a fiber texture approximated by a strong 〈111〉 and a weak 〈100〉 component. However, its microtexture, as measured by electron backscattered diffraction (EBSD), indicated that the major 〈111〉+minor 〈100〉 duplex fiber texture was dominant only in the center region, while a relatively diffuse texture developed with a somewhat higher density of orientations having a 〈11w〉//wire axis in the middle and surface regions. The inhomogeneous texture in the as-deformed wire gave rise to an inhomogeneous microstructure and texture after annealing. When annealed at 300 °C or 600 °C for 3 hours, the wire developed a duplex fiber texture consisting of major 〈100〉+minor 〈111〉 components in the center region, a strong 〈100〉 fiber texture in the middle region, and a weak texture consisting of 〈111〉 and 〈100〉 components with the 〈111〉 component being slightly stronger in the surface region. When the drawn wire was annealed at the high temperature of 700 °C, the texture at short annealing times was similar to that of the wire annealed at the lower temperatures of 300 °C and 600 °C for 3 hours, but prolonged annealing gave rise to a texture ranging from the 〈111〉 to 〈112〉 components due to abnormal grain-growth that started in the surface region. The recrystallization texture consisting of the major 〈100〉+minor 〈111〉 components was explained by the strain-energy-release maximization (SERM) model, in which the recrystallization texture is determined such that the absolute maximum principal stress direction due to dislocations in the deformed state is along the minimum elastic-modulus direction in recrystallized grains. On the other hand, the abnormal grain-growth texture was attributed to grain-boundary mobility differences between differently oriented grain.

Structures of nanometre-size crystals determined from selected-area electron diffraction data

Abstract: The structure of a new modification of Ti2Se, the β-phase, and several related inorganic crystal structures containing elements with atomic numbers between 16 and 40 have been solved by quasi-automatic direct methods from single-crystal electron diffraction patterns of nanometre-size crystals, using the kinematical aproxi­mation. The crystals were several thousand times smaller than the minimum size required for single-crystal X-ray diffraction. Atomic coordinates were found with an average accuracy of 0.2 A or better. Experimental data were obtained by standardized techniques for recording and quantifying electron diffraction patterns. The SIR97 program for solving crystal structures from three-dimensional X-ray diffraction data by direct methods was modified to work also with two-dimensional electron diffraction data.

Electron diffraction from carbon nanotubes

Abstract: The properties of a carbon nanotube are dependent on its atomic structure. The atomic structure of a carbon nanotube can be defined by specifying its chiral indices, (u, v), that specify its perimeter vector (chiral vector), with which the diameter and helicity are also determined. The fine electron beam available in a modern transmission electron microscope (TEM) offers a unique probe to reveal the atomic structure of individual nanotubes.This review covers two aspects related to the use of the electron probe in the TEM for the study of carbon nanotubes: (a) to understand the electron diffraction phenomena for inter-pretation of the electron diffraction patterns of carbon nanotubes and (b) to obtain the chiral indices, (u, v), of the carbon nanotubes from the electron diffraction patterns.For a nanotube of a given structure, the electron scattering amplitude from the carbon nanotube is first described analytically in closed form using the helical diffraction theory. From a known structure as given by the chiral indices (u, v), its electron diffraction pattern can be calculated and understood.The reverse problem, i.e. assignment of the chiral indices from an electron diffraction pattern of a carbon nanotube, is approached from the relationship between the electron scattering intensity distribution and the chiral indices (u, v). We show that electron diffraction patterns can provide an accurate and unambiguous assignment of the chiral indices of carbon nanotubes. The chiral indices (u, v) can be read indiscriminately with a high accuracy from the intensity distribution on the principal layer lines in an electron diffraction pattern.The symmetry properties of electron diffraction from carbon nanotubes and the electron diffraction from deformed carbon nanotubes are also discussed in detail. It is shown that 2mm symmetry is always preserved for single-walled carbon nanotubes, but it can break down for multiwalled carbon nanotubes under some special circumstances.Finally, determination of the handedness of carbon nanotubes using electron diffraction is reviewed and discussed with both theoretical analysis and experimental examples.