Electron backscatter diffraction

About: Electron backscatter diffraction is a research topic. Over the lifetime, 15184 publications have been published within this topic receiving 317847 citations. The topic is also known as: EBSD.

Correlation of microstructure and charpy impact properties in API X70 and X80 line-pipe steels

Abstract: This study aims at correlating microstructure and Charpy impact properties in high-toughness API X70 and X80 line-pipe steels. Three kinds of steels were fabricated by varying alloying elements and hot rolling conditions, and their microstructures and Charpy impact properties were investigated. In addition, their effective grain sizes were characterized by the electron back-scatter diffraction (EBSD) analysis. The Charpy impact test results indicated that the steels rolled in the single phase region had the higher upper shelf energy (USE) than the steel rolled in the two phase region because their microstructures were composed of acicular ferrites. In the X80 steel rolled in the single phase region, the decreased energy transition temperature (ETT) could be explained by the decrease in the overall effective grain size due to the presence of acicular ferrite having smaller effective grain size. Thus, it had excellent mechanical properties in yield and tensile strengths, absorbed energy, and transition temperature, except in ductility.

Rietveld texture analysis from TOF neutron diffraction data

Abstract: One of the advantages of a multidetector neutron time-of-flight diffractometer such as the high pressure preferred orientation diffractometer (HIPPO) at the Los Alamos Neutron Science Center is the capability to measure efficiently preferred orientation of bulk materials. A routine experimental method for measurements, both at ambient conditions, as well as high or low temperatures, has been established. However, only recently has the complex data analysis been streamlined to make it straightforward for a noninitiated user. Here, we describe the Rietveld texture analysis of HIPPO data with the computer code Materials Analysis Using Diffraction (MAUD) as a step-by-step procedure and illustrate it with a metamorphic quartz rock. Postprocessing of the results is described and neutron diffraction results are compared with electron backscatter diffraction measurements on the same sample.

Improved precision in strain measurement using nanobeam electron diffraction

Abstract: Improvements in transmission electron microscopy have transformed nanobeam electron diffraction into a simple and powerful technique to measure strain. A Si0.69Ge0.31 layer, grown onto a Si substrate has been used to evaluate the precision and accuracy of the technique. Diffraction patterns have been acquired along a ⟨110⟩ zone axis using a FEI-Titan microscope and have been analyzed using dedicated software. A strain precision of 6×10−4 using a probe size of 2.7 nm with a convergence angle of 0.5 mrad has been reached. The bidimensional distortion tensor in the plane perpendicular to the electron beam has been obtained.