Electron backscatter diffraction

About: Electron backscatter diffraction is a research topic. Over the lifetime, 15184 publications have been published within this topic receiving 317847 citations. The topic is also known as: EBSD.

A Medipix quantum area detector allows rotation electron diffraction data collection from submicrometre three-dimensional protein crystals

Abstract: When protein crystals are submicrometre-sized, X-ray radiation damage precludes conventional diffraction data collection. For crystals that are of the order of 100 nm in size, at best only single-shot diffraction patterns can be collected and rotation data collection has not been possible, irrespective of the diffraction technique used. Here, it is shown that at a very low electron dose (at most 0.1 e− A−2), a Medipix2 quantum area detector is sufficiently sensitive to allow the collection of a 30-frame rotation series of 200 keV electron-diffraction data from a single ∼100 nm thick protein crystal. A highly parallel 200 keV electron beam (λ = 0.025 A) allowed observation of the curvature of the Ewald sphere at low resolution, indicating a combined mosaic spread/beam divergence of at most 0.4°. This result shows that volumes of crystal with low mosaicity can be pinpointed in electron diffraction. It is also shown that strategies and data-analysis software (MOSFLM and SCALA) from X-ray protein crystallography can be used in principle for analysing electron-diffraction data from three-dimensional nanocrystals of proteins.

Evolution of microstructure in laser deposited Al-11.28%Si alloy

Abstract: Laser melting of Al–Si alloys has been investigated extensively, however, little work on the microstructural evolution of laser deposited Al–Si alloys has been reported to date. This paper presents a detailed microstructural investigation of laser deposited Al–11.28Si alloy. Laser aided direct metal deposition (DMD) process has been used to build up solid thin wall samples using Al 4047 prealloyed powder. The evolution of macro- and microstructures of laser deposited Al–Si samples was investigated using X-ray diffraction, optical microscopy, scanning electron microscopy and electron backscattered diffraction techniques. Microstructural observation revealed that the morphology and the length scale of the microstructures are different at different locations of the sample. A periodic transition of microstructural morphology from columnar dendrite to microcellular structure was observed in each layer. The observed difference in the microstructure was correlated with the thermal history of the deposit.