Topic
Energy filtered transmission electron microscopy
About: Energy filtered transmission electron microscopy is a research topic. Over the lifetime, 5018 publications have been published within this topic receiving 123097 citations.
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01 Jun 1977
TL;DR: Hirsch et al. as mentioned in this paper described further experiments on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy.
Abstract: In continuation of an earlier publication (Hoppe et al., 1968), further experiments are described here on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy Peter B. Hirsch, Electron Works by Peter B. Hirsch: Electron Microscopy of Thin Crystals Peter B. Hirsch Author of Electron Microscopy of Thin Crystals
4,077 citations
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TL;DR: In this paper, the authors introduce the fundamentals of TEM and its applications in structural determination of shape-controlled nanocrystals and their assemblies, and demonstrate in situ TEM for characterizing and measuring the thermodynamic, electric, and mechanical properties of individual nanostructures, from which the structure−property relationship can be registered with a specific nanoparticle/structure.
Abstract: The physical and chemical properties of nanophase materials rely on their crystal and surface structures. Transmission electron microscopy (TEM) is a powerful and unique technique for structure characterization. The most important application of TEM is the atomic-resolution real-space imaging of nanoparticles. This article introduces the fundamentals of TEM and its applications in structural determination of shape-controlled nanocrystals and their assemblies. By forming a nanometer size electron probe, TEM is unique in identifying and quantifying the chemical and electronic structure of individual nanocrystals. Electron energy-loss spectroscopy analysis of the solid-state effects and mapping the valence states are even more attractive. In situ TEM is demonstrated for characterizing and measuring the thermodynamic, electric, and mechanical properties of individual nanostructures, from which the structure−property relationship can be registered with a specific nanoparticle/structure.
1,980 citations
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TL;DR: Introduction to Biological Scanning Electron Microscopy by M. A. Hayat.
Abstract: Introduction to Biological Scanning Electron Microscopy. By M. A. Hayat. Pp.323 (University Park Press: Baltimore, Maryland, London and Tokyo, 1978.) £9.25.
1,166 citations
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16 Mar 2009
TL;DR: Particle Optics of Electrons as mentioned in this paper, wave and wave-optics of electrons, and wave and phase contrast of Electron Spectroscopy have been studied extensively in the literature.
Abstract: Particle Optics of Electrons.- Wave Optics of Electrons.- Elements of a Transmission Electron Microscope.- Electron-Specimen Interactions..- Scattering and Phase Contrast.- Theory of Electron Diffraction.- Electron-Diffraction Modesand Applications ..- Imaging of Crystalline Specimens and Their Defects..- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy..- Specimen Damage by Electron Irradiation.
1,152 citations