Topic
Equivalent series resistance
About: Equivalent series resistance is a research topic. Over the lifetime, 5335 publications have been published within this topic receiving 83362 citations. The topic is also known as: ESR.
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TL;DR: In this article, an electro-thermal coupled model for pouch battery LiFePO4/C is developed in normal discharge and internal short circuit process, where the battery is discretized into many cell elements which are united as a 2D network equivalent circuit.
83 citations
TL;DR: In this article, the authors developed a detailed model of GaSb and GaInAsSb PV diodes, which describes the electrical behavior of the diode as a function of the operating point defined by a photocurrent and a junction temperature.
83 citations
TL;DR: In this paper, the authors measured the R-V curves of n-onp Hg1−CdxTe long-wavelength infrared photodiodes forming 128-element array and fitted them by the simultaneousmode nonlinear fitting program.
Abstract: Resistance-voltage curves of n-on-p Hg1−хCdxTe long-wavelength infrared photodiodes forming 128-element array are measured in the temperature range of 40–150 K. Experimentally obtained characteristics are fitted by the simultaneous-mode nonlinear fitting program. The dark current mechanisms induced by diffusion, generation recombination, trap-assisted tunneling, band-to-band tunneling, and series resistance effect are included in the physical model for R-V curve fitting. Six characteristic parameters as function of temperature are extracted from measured R-V curves. The characteristics of extracted current components at low temperatures indicate significant contributions from tunneling effects, which is the dominant leakage current mechanism for reverse bias greater than approximately 50 mV. The Hg-vacancy-induced acceptor trap tends to invert to donor type at higher temperature, typically larger than 120 K, while it can maintain stable at the temperature of 60–40 K. The stable temperature of ion-implanta...
83 citations
TL;DR: In this article, the authors proposed a technique for extracting the equivalent circuit parameters of the inductor and determining the frequency-dependent effective rod permeability as well as the intrinsic permeability of the ferrite-core material.
Abstract: Ferrite-core inductors play an important role in electromagnetic noise suppression The radio-frequency (RF) equivalent circuit modeling of the inductor is very useful for characterizing the inductor and for noise filtering studies A technique is proposed for extracting the equivalent circuit parameters of the inductor and determining the frequency-dependent effective rod permeability as well as the intrinsic permeability of the ferrite-core material The equivalent series resistance, inductance, and the lumped shunt parasitic capacitance have been calculated versus frequency for a slug-type inductor and a toroidal-type inductor The effective rod permeability of the ferrite rod used in the slug-type inductor and the intrinsic permeability of the ferrite core used in the toroidal-type inductor have also been estimated as a function of frequency The calculated intrinsic permeability of the toroidal core agrees very well with that measured by the HP4291A RF Material Analyzer The proposed method is simple and accurate In addition, it provides an alternative way for characterizing ferrite cores at radio frequencies
83 citations
IBM1
TL;DR: In this article, a method is described to determine MOSFET channel length, mobility, gate bias dependence and parasitic series resistance by curve fitting output resistance measurements over a range of gate biases and channel lengths.
Abstract: A method is described to electrically determine MOSFET channel length, mobility, gate-bias dependence and parasitic series resistance. These four quantities are obtained by curve fitting output resistance measurements over a range of gate biases and channel lengths. Measurements from two gate biases on each of two devices of different channel lengths are sufficient to obtain a full characterization. Thus, the method is well suited for automated testing because of its simplicity and efficiency.
83 citations