Showing papers on "Erbium published in 1983"
TL;DR: In this article, the emission spectra and lifetimes of erbium in fluorozirconate glass, in lead-gallium-zinc fluoride glass, and in yttrium-zirconium oxide crystal were measured and compared with the theoretical calculations.
51 citations
TL;DR: In this paper, planar ErSi 2 layers (pit free) are made using the third approach with a sample structure of a-Si/Er/c-Si where c-Si denotes crystalline silicon.
34 citations
TL;DR: In this article, the metastable-state absorption cross-section at the laser emission wavelength of an erbium glass laser was estimated for the first time, allowing the careful examination of excited absorption and other channels of energy losses on emission characteristics.
26 citations
17 citations
01 Sep 1983
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TL;DR: The functional composition and structure of polychelates of erbium and ytterbium based on tetraacetylethane have been determined from the results of elemental analysis, from the IR spectra and the reflection spectra in the visible region (400-800 nm) and from the DTA and TGA curves as discussed by the authors.
Abstract: Polymeric chelates containing erbium and ytterbium have been synthesized and some of their properties discussed. We took as initial compounds erbium and ytterbium acetates and tetraacetyl ethane (3,4-diacetylhexanedione-2,5), the latter having the two pairs of donor groups that are necessary for coordination with metals. The functional composition and structure of polychelates of erbium and ytterbium based on tetraacetylethane have been determined from the results of elemental analysis, from the IR spectra and the reflection spectra in the visible region (400–800 nm) and from the DTA and TGA curves.
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TL;DR: In this article, the LiYF4:Er laser at 0.85 μ was observed in the three-level lasing regime, which could be useful in tackling the problem of increasing the output energy characteristics of this laser.
Abstract: Operation of an LiYF4:Er laser at 0.85 μ was observed in the three-level lasing regime, which could be useful in tackling the problem of increasing the output energy characteristics of this laser.
01 Oct 1983
TL;DR: In this article, the dielectric analysis and measurements of thermally evaporated erbium fluoride thin films were performed for thin-film hybrid integrated circuits with high precision capacitors.
Abstract: Very high precision capacitors with good stability are required for the fabrication of thin film hybrid integrated circuits. Materials that warrant such attention include rare earth fluorides and oxides owing to their mechanical and chemical stability [1]. Erbium fluoride films have been studied with regard to its electroluminescence only [2]. This paper reports an investigation on the dielectric analysis and measurements of thermally evaporated erbium fluoride thin films.