Showing papers on "Erbium published in 1985"

Sensitized laser glass

Abstract: A sensitized laser glass which includes a primary lasing dopant and auxiliary dopants which absorb in regions of the flashlamp emission spectrum away from the absorption bans of the primary dopant and transfer the energy absorbed to the primary dopant, thus improving the efficiency and sensitivity of the laser glass. The auxiliary dopant comprises the combination of cerium and chromium as Ce2 O3 and Cr2 O3 and the primary dopant is a rare earth metal, preferably neodymium or erbium as Nd2 O3 or Er2 O3. Th auxiliary dopant consists essentially of 0.1 to 5% by weight Ce2 O3 and 0.025 to 0.1% by weight Cr2 O3, however the preferred concentration of the auxiliary dopant is 2 to 4% by weight Ce2 O3 plus 0.03 to 0.07% by weight Cr2 O3. The experimental data establishes that such auxiliary dopants are particularly suitable for phosphate laser glasses.

Electrical Resistivity of Erbium Purified by Solid-State Electro-Transport Method

Abstract: A solid-state electro-transport method was used to purify erbium, increasing the residual resistance ratio of the metal from 4 to 46. It was observed that the migration of major impurities in erbium is directed toward the anode and that on environmental atmospheric pressure of the order of 10-10 Torr is required for impurity migration to occur. The electrical resistivity and magnetic transition temperature were measured with purified erbium samples, and the Neel temperature, the intermediate temperature, and the Curie temperature were found to be 88 K, 55 K and 19 K, respectively, for the purest specimen. Furthermore, a jump was found to occur in the resistivity curve at 27 K. The values of the above temperature veried from specimen to specimen.

Spectral studies of Nd3+ and Er3+ ions in POCl3:SnCl4 laser liquid

Abstract: The optical absorption spectra of triply ionized neodymium and erbium ions in POCl3∶SnCl4 laser liquid have been studied for the first time in the UV-VIS and NIR regions. Spectroscopic and Judd-Ofelt intensity parameters are evaluated from the observed band positions and their intensities. Radiative lifetimes and the luminescent branching ratios for the excited fluorescent levels of Nd3+ and Er3+ ions are theoretically estimated and the possible laser transitions are indicated. From the observed splittings of certain bands in the second-derivative spectrum of the Nd3+ ion, the crystal field (A20,A40) parameters are evaluated assumingC3h symmetry for the ion.

Erbium laser oscillator

Abstract: PURPOSE:To improve the efficiency of oscillation by interposing a neodymium laser medium between an erbium laser medium containing erbium Er ions and ytterbium Yb ions and a light source for excitation. CONSTITUTION:Neodymium laser media 2, 2' containing Nd ions on both the surface and the back of an erbium laser medium 1 containing Er ions and Yb ions, a solid-state laser element, on an outer surface thereof reflecting films 3, 3' are formed, and cylindrical flash lamps 4, 4' as light sources for excitation are housed in a lamp house 5 directly or through supporters 6. Inflow ports 7 and outflow ports 8 for a refrigerant are formed to the lamp house 5, and transmitting windows 9, 9' emitting laser beams to a total reflection mirror 10 and a semi-transmitting mirror 10' are shaped onto the optical axis of the solid-state laser element.

Structural and electrical characteristics of vacuum‐evaporated erbium fluoride thin films

Abstract: Thin‐film capacitors of erbium fluoride were fabricated by thermal evaporation. The film structure was analyzed by x‐ray diffractogram and confirmed by the x‐ray small‐angle surface reflection technique. The current–voltage characteristics of these films were studied at different temperatures in the range of 300–390 K. It was observed that at high electric fields the current increases linearly with the square root of the field. The conduction mechanism was found to be predominantly by Poole–Frenkel emission in these films and is an activated process with the activation energy decreasing with increasing electric field.

Muon spin relaxation in ErRh4B4

Abstract: Data on zero‐field μSR in ErRh4B4 are presented for temperatures from 4 to 300 K. Due to the large erbium moment, most of the muons have a relaxation time of less than 10 ns for temperatures below about 50 K. The data have been analyzed in terms of two distinct muon sites in the material. The deduced erbium relative fluctuation rate versus temperature is related to the crystalline electric field levels of erbium in the RERh4B4 structure.

X-ray fluorescence spectrometric analysis of erbium oxide for rare earth impurities

Abstract: An X-ray fluorescence spectrometric method has been developed for the analysis of high purity erbium oxide for the determination of yttrium, terbium, dysprosium, holmium, thulium, ytterbium and lutetium oxide impurities in the concentration range 0.005–0.1%. The sample is taken in oxalate form, mixed with a binder (boric acid) in the weight ratio 3∶1 and made into a double layer pellet. The analysis is done on a Philips PW 1220 X-ray fluorescence spectrometer using a LiF (200) analyzing crystal. The precision at each concentration of the standards and theoretical minimum detection limit for each element has been calculated.