scispace - formally typeset
Search or ask a question

Showing papers on "Fabrication published in 1989"


Journal ArticleDOI
TL;DR: In this paper, the authors describe the design, fabrication and operation of several micromotors that have been produced using integrated-circuit processing and demonstrate that rotors and stators for these motors are formed from polycrystalline silicon 1.0-1.5 μm thick.

453 citations


Journal ArticleDOI
TL;DR: In this paper, the production methods for α-BN powders and dense shapes, their physical and chemical properties, industrial uses and potentialities are reviewed, and a detailed discussion of the potential uses and applications are presented.
Abstract: The production methods for α-BN powders and dense shapes, their physical and chemical properties, industrial uses and potentialities are reviewed.

409 citations



Journal ArticleDOI
TL;DR: In this paper, the design and fabrication of a 19*19 star coupler suitable for lightwave distribution in high-capacity local area networks with a measured efficiency of 55% at a wavelength of 1.3 mu m is reported.
Abstract: The design and fabrication of a 19*19 star coupler suitable for lightwave distribution in high-capacity local area networks with a measured efficiency of 55% at a wavelength of 1.3 mu m is reported. The coupler consists of two arrays of channel waveguides separated by a slab waveguide fabricated on a silicon substrate using SiO/sub 2//Si technology. The integrated optics design is well suited to manufacture. It is argued that the coupler performance does not depend critically on the fabrication accuracy. In fact, the efficiency is primarily determined by the radiating element pattern, whose effective angular aperture is essentially determined by the width Omega of the first Brillouin zone, and, therefore, it is not greatly influenced by the fabrication process. >

141 citations


Journal ArticleDOI
TL;DR: In this article, a new process for the fabrication of silicon p-i-n diode radiation detectors is described, where the utilization of backside gettering in the fabrication process results in the actual physical removal of detrimental impurities from critical device regions.
Abstract: A new process for the fabrication of silicon p-i-n diode radiation detectors is described. The utilization of backside gettering in the fabrication process results in the actual physical removal of detrimental impurities from critical device regions. This reduces the sensitivity of detector properties to processing variables while yielding low diode reverse-leakage currents. In addition, gettering permits the use of processing temperatures compatible with integrated-circuit fabrication. P-channel MOSFETs and silicon p-i-n diodes have been fabricated simultaneously on 10 k..cap omega../center dot/cm silicon using conventional integrated-circuit processing techniques. 25 refs., 5 figs.

102 citations


Journal ArticleDOI
TL;DR: In this paper, thin-film fabrication techniques for forming three-dimensional point contacts are presented, and as-fabricated nanobridges can be modified using electromigration to make the constriction region smaller or dirtier.
Abstract: Thin‐film fabrication techniques for forming three‐dimensional ‘‘point contacts’’ are presented. As‐fabricated nanobridges can be modified using electromigration to make the constriction region smaller or dirtier. Scientific applications to quantum transport studies, 1/f noise, and electromigration are discussed.

86 citations


Journal ArticleDOI
TL;DR: In this article, a focused argon ion laser beam (λ=350 nm) is used to fabricate optical channel waveguides on oxidized silicon wafers using a commerically available spin-on polymer.
Abstract: A focused argon‐ion laser beam (λ=350 nm) is used to fabricate optical channel waveguides on oxidized silicon wafers using a commerically available spin‐on polymer. The polymerization process is photon induced, thus allowing the reaction to occur in a room‐temperature ambient. This allows the fabrication of waveguides on a variety of substrates including those with low melting points. The losses in these waveguides are typically less then 1 dB/cm, making them applicable to a variety of optical interconnect problems. In particular, we demonstrate their use in the fabrication of an optical power tap.

78 citations


01 Jan 1989
TL;DR: In this paper, a carbothermic-reduction/nitriding process was developed to synthesize UN powders, which were loaded into Nb-1 Zr cladding tubes, irradiated in a fast test reactor, and destructively examined after 0.8 at% burnup.
Abstract: Abstract Uranium nitride fuel was selected for previous space power reactors because of its attractive thermal and physical properties; however, all UN fabrication and testing activities were terminated over ten years ago. An accelerated irradiation test, SP-1, was designed to demonstrate the irradiation performance of Nb-1 Zr clad UN fuel pins for the SP-100 program. A carbothermic-reduction/nitriding process was developed to synthesize UN powders. These powders were fabricated into fuel pellets by conventional cold-pressing and sintering. The pellets were loaded into Nb-1 Zr cladding tubes, irradiated in a fast-test reactor, and destructively examined after 0.8 at% burnup. Preliminary postirradiation examination (PIE) results show that the fuel pins behaved as designed. Fuel swelling, fission-gas release, and microstructural data are presented, and suggestions to enhance the reliability of UN fuel pins are discussed.

68 citations


Patent
24 Mar 1989
TL;DR: In this article, a method for the fabrication of field emission peaks using a monocrystalline substrate with a suitable orientation coated with an insulating layer where square-shaped elementary zones had been removed has been described.
Abstract: Disclosed is a method for the fabrication of field emission peaks using a monocrystalline substrate with a suitable orientation coated with an insulating layer where square-shaped elementary zones with a suitable orientation with respect to the substrate have been removed. Silicon is deposited by selective epitaxy in these zones. The epitaxial growth of silicon, at high speed parallel to the substrate and at low speed along faces of the substrate at 45° to the substrate, enables the making of pyramidal peaks which, afater being coated with tungsten, form emitting peaks.

56 citations


Journal ArticleDOI
TL;DR: In this article, the Ni 3 AlAl 2 O 3 system is used for the fabrication of intermetallic matrix composites, which combines reactive sintering, powder injection molding and hot isostatic compaction to form an aligned fiber composite.
Abstract: Research into the fabrication of intermetallic matrix composites is presented using the Ni 3 AlAl 2 O 3 system as the baseline. The approach combines reactive sintering, powder injection molding, and hot isostatic compaction to form an aligned fiber composite. The individual components to this process are described with example microstructures and mechanical properties. The initial successes and problems are described. The paper concludes with a description of the major remaining processing challenges in the fabrication of intermetallic matrix composites.

53 citations


Journal ArticleDOI
TL;DR: The use of grain-oriented Bi/sub 4/Ti/sub 3/O/sub 12/ ceramics as a high-temperature piezoelectric transducer is suggested.
Abstract: The concept of grain-oriented fabrication in ceramics, which utilizes anisotropy either in morphology or some specific property of the particle, is reviewed. A fabrication method, which maximizes the grain orientation, is described for Bi/sub 4/Ti/sub 3/O/sub 12/. The process utilized plate-like morphology of Bi/sub 4/Ti/sub 3/O/sub 12/ particles and yielded a ceramic with an X-ray density of 95.4% and an unprecedented value of 100% for Lotgering's orientation factor in the direction of orientation. The dielectric and piezoelectric properties of this ceramic are described and compared to single crystal values. Complex impedance analysis of the ceramics was used to explain the dielectric relaxations at elevated temperatures. The use of grain-oriented fabrication as a practical technique for making polycrystalline ceramics with electrical properties close to those of single crystals (in the direction of orientation) is emphasized. The use of grain-oriented Bi/sub 4/Ti/sub 3/O/sub 12/ ceramics as a high-temperature piezoelectric transducer is suggested. >

Patent
20 Nov 1989
TL;DR: In this article, the use of a three-step base doping technique enables the characteristics of a vertical bipolar transistor to be controllably reproduced at highly optimal values from run to run.
Abstract: In a transistor fabrication process, the use of a three-step base doping technique enables the characteristics of a vertical bipolar transistor to be controllably reproduced at highly optimal values from run to run. Insulating spacers (52A) are employed in forming a self-aligned base contact zone (58B). A shallow emitter (46) is created by outdiffusion from a patterned non-monocrystalline semiconductor layer (38A) that serves as the emitter contact. The fabrication process is compatible with the largely simultaneous manufacture of an insulated-gate field-effect transistor of the lightly doped drain type.

Journal ArticleDOI
TL;DR: In this paper, the optical contrast between crystalline and ion beam amorphized regions in SiC has been studied by transmission spectrometry for photon energies ranging up to the ultraviolet, and the working range of such an optical device with crystalline/amorphous patterns, e.g., for use as a photolithographic mask, is extended to considerably higher photon energies than with Si as a recording material.
Abstract: The optical contrast between crystalline and ion beam amorphized regions in SiC has been studied by transmission spectrometry for photon energies ranging up to the ultraviolet. The working range of such an optical device with crystalline/amorphous patterns, e.g., for use as a photolithographic mask, is extended to considerably higher photon energies than with Si as a recording material. Thus, SiC, in the form of thin crystalline layers on a transparent substrate, is a promising candidate for submicron structuring in various fields of application.

Journal ArticleDOI
TL;DR: In this paper, it is demonstrated that the thermal oxidation of silicon can be enhanced without introducing additional impurities, which is one of the important processing steps in the fabrication of integrated circuit devices.
Abstract: It is demonstrated, that the thermal oxidation of silicon, which is one of the important processing steps in the fabrication of integrated circuit devices, can be enhanced without introducing additional impurities.


Book
01 Jan 1989
TL;DR: In this paper, the authors describe the application of laser processing techniques in the fabrication of semiconductor materials and devices for the microelectronics industry and present a collection of reviews of interest to those involved with a semiconductor fabrication facility.
Abstract: This book describes the application of laser processing techniques in the fabrication of semiconductor materials and devices for the microelectronics industry. It comprises a collection of reviews of interest to those involved with a semiconductor fabrication facility.

Journal ArticleDOI
TL;DR: In this paper, the authors considered the Al/Ta multilayer combination and showed that the deleterious effects of compressive or tensile intrinsic stresses can be minimized by optimizing both substrate temperature and working gas pressure during the deposition process.
Abstract: Transmissive multilayer optics have a potential application in the development of high‐resolution x‐ray microscope and spectrometer systems. Difficulties encountered in the sputter deposition of these multilayer optical structures can be overcome by careful control of the fabrication parameters. The deleterious effects of compressive or tensile intrinsic stresses can be minimized by optimizing both substrate temperature and working gas pressure during the deposition process. This study specifically considers the Al/Ta multilayer combination.


Proceedings ArticleDOI
01 Aug 1989
TL;DR: In this paper, direct-write electron beam lithography and multilayer resist processing for the fabrication of T-shaped gates was discussed and a series of computer programs were written to simulate the development process in a multilayers of electron resists.
Abstract: This paper will discuss direct-write electron beam lithography and multilayer resist processing for the fabrication of T-shaped gates. Gates whose length at the bottom of the "T" are less than 100 nm have been fabricated by this method using a multilayer of polynethylnethacrylate and lift-off. Because of the large cross-section of the T-gate, the resistance is reduced. The end-to-end resistance of the 100 nm T-shaped lines was less than 25) Ohninin as compered to 2000 Ohm/nin for a 100 nm conventional gate, i.e., an eight-fold decrease. In order to facilitate the fabrication of these gates a series of computer programs were written to simulate the development process in a multilayer of electron resists. These programs are based on a string development model of resist development. They allowed rapid prediction of the resist profiles. As a demonstration of the increased device performance made possible by this prociss, modulation-doped field effect transistors (HOLEY) have been fabricated using these T-gate structures . The extrapolated unity current gain frequency (ft) of these transistors is 113 Gilz.

Journal ArticleDOI
TL;DR: In this article, a new fabrication process for superconducting oxide ceramic fibers, the alginate method, is proposed, based on a gelation of a sodium alginates aqueous solution by sodium ion exchange with protons or multivalent metal ions.
Abstract: A new fabrication process for superconducting oxide ceramic fibers, the alginate method, is proposed. This process is based on a gelation of a sodium alginate aqueous solution by sodium ion exchange with protons or multivalent metal ions. Dense Y-Ba-Cu-O superconducting fibers have been successfully fabricated by firing Y-Ba-Cu-alginate fibers at temperatures above 900°C. The fibers have shown a tensile strength of 192 MPa and an end-point critical temperature of 85 K.

Patent
31 Jul 1989
TL;DR: In this paper, the registration marks are formed at the edges of oxide layers, located at the surface of a silicon body, by means of forming metal silicide layers having edges coincident with the edge of the oxide layers.
Abstract: In order to reduce alignment errors arising in the fabrication of semiconductor integrated circuits using electron beam lithography, enhanced registration marks--(i.e., registration marks that are more easily and accurately detectable by the electron beam)--are formed at the edges of oxide layers, located at the surface of a silicon body, by means of forming metal silicide layers having edges coincident with the edges of the oxide layers. Advantageously, the enhancing of the registgration marks by forming the metal silicide is performed subsequent to any high temperature processing steps, whereby the integrity of the marks is maintained.

Journal ArticleDOI
TL;DR: Lightweight Si/SiC mirrors of nominal diameter 7.5 cm have been fabricated via a scalable and rapid CVD process to demonstrate the CVD mirror fabrication technology as discussed by the authors, which can be extended to include mirrors of other ceramic materials such as TiB2 and B4C. The CVD fabrication process is fast and has the potential to yield several mirrors in a few weeks time from a single reactor.
Abstract: Lightweight Si/SiC mirrors of nominal diameter 7.5 cm have been fabricated via a scalable and rapid CVD process to demonstrate the CVD mirror fabrication technology. These mirrors consist of a faceplate of either Si or Si-coated SiC and a lightweight backstructure made of either Si or SiC. The mirrors were polished to a figure better than 1/5th of a wave at 0.6328 A and a finish of better than 10 A rms. A procedure for fabricating these mirrors is described. The CVD fabrication process is fast and has the potential to yield several mirrors in a few weeks time from a single reactor. The CVD mirror fabrication technology is quite general and can be extended to include mirrors of other ceramic materials such as TiB2 and B4C.

Journal ArticleDOI
TL;DR: Gas immersion laser doping (GILD) is used to fabricate the base and emitter regions of narrow-base n-p-n bipolar transistors as mentioned in this paper. But the GILD process is unique in that it allows simple fabrication of box-like impurity profiles which can be placed very accurately in the vertical dimension (+or-100 AA).
Abstract: Gas immersion laser doping (GILD) is used to fabricate the base and emitter regions of narrow-base n-p-n bipolar transistors. The GILD process is unique in that it allows simple fabrication of box-like impurity profiles which can be placed very accurately in the vertical dimension (+or-100 AA). Transistors with base widths ranging from 700 to 1200 AA and DC forward current gains greater than 50 are fabricated. >

Journal ArticleDOI
D.B. Mortimore1
TL;DR: In this paper, the fabrication and performance of a monolithic 4×4 single-mode fused coupler is reported, and two propagation paths are seen to be wavelength-flat between 1.2 μm and 1.6 μm.
Abstract: The fabrication and performance of a monolithic 4×4 single-mode fused coupler is reported. Measurements show that the device exhibits excellent coupling uniformity together with low excess loss. Two propagation paths are seen to be wavelength-flat between 1.2 μm and 1.6 μm, and two paths have a small coupling variation which may be minimised by fabrication technique.


Journal ArticleDOI
TL;DR: In this paper, a process for the fabrication of mirror facets for AlGaAs/GaAs laser diodes is described, where the major requirements for high quality mirrors have been fulfilled by using Cl 2 /Ar chemically assisted ion beam etching (CAIBE) and a new multilayer mask structure that produces the smoothest facets.

Patent
13 Nov 1989
TL;DR: In this article, a monolithic silicon membrane structure is constructed from a single ultra-thick body of silicon, which is then removed by mechanical grinding and chemical etching to provide a well opening in the silicon body terminating in the doped membrane.
Abstract: The method of fabrication of a monolithic silicon membrane structure in which the membrane and its supporting framework are constructed from a single ultra thick body of silicon. The fabrication sequence includes the steps of providing a doped membrane layer on the silicon body, forming an apertured mask on the silicon body, and removal of an unwanted silicon region by mechanical grinding and chemical etching to provide a well opening in the silicon body terminating in the doped membrane.

Patent
23 Feb 1989
TL;DR: In this article, an improved fabrication of superconducting films is disclosed whereby a multi-phase Y-Ba-Cu-O compound is utilized, which is formed by sputtering of a target material consisting of the super-conducting 123 phase Y1Ba2Cu3O7 onto the green 211 phase Y2BaCuO5.
Abstract: An improved fabrication of superconducting films is disclosed whereby a multi-phase Y-Ba-Cu-O compound is utilized. The film is formed by sputtering of a target material consisting of the superconducting 123 phase Y1Ba2Cu3O7 onto the green 211 phase Y2BaCuO5. After annealing, the superconducting characteristic, of the formed film, in terms of transition width and Tc, are improved over those using other oxide compounds as substrates.

Journal ArticleDOI
TL;DR: In this article, a novel high-density multilayer interconnect (HDMI) technology has been shown to provide very high functional densities and a fabrication platform for extremely compact and complex systems.
Abstract: A novel high-density multilayer interconnect (HDMI) technology has been shown to provide very high functional densities and a fabrication platform for extremely compact and complex systems. The technology comprises an interconnect fabrication method for microelectronic circuits based on vacuum thin-film metallization and polymeric insulation between layers. The HDMI technology makes wafer-scale integration realistic by using a hybrid concept. Semiconductor devices can be built to the practical limit of reasonable yields, then regrouped on a substrate to achieve the desired level of integration. The technology is discussed in connection with photolithography, the effect of three-dimensional topography, alternatives for the definition of metal patterns, and the pattern of polymers. >