Topic
Fault coverage
About: Fault coverage is a research topic. Over the lifetime, 10153 publications have been published within this topic receiving 161933 citations. The topic is also known as: test coverage.
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TL;DR: Using ESPRIT, an automatic test pattern generation (ATPG) system for testing single stuck-at faults in combinational logic, the system has observed orders-of-magnitude reduction in the number of random trials required to obtain a given fault coverage.
Abstract: This paper presents ESPRIT, an automatic test pattern generation (ATPG) system for testing single stuck-at faults in combinational logic. ESPRIT generates test patterns by performing fault simulation on random patterns derived from nonuniformly distributed input signal probabilities. The system computes input signal probabilities that minimize a testability cost function. Using ESPRIT, we have observed orders-of-magnitude reduction in the number of random trials required to obtain a given fault coverage.
103 citations
30 Jul 2013
TL;DR: The results indicate that FLP and TCP can statistically significantly reduce fault localization costs for 73% and 76% of cases, respectively, and that FLINT significantly outperforms similarity-based localization techniques in 52% of the cases considered in the study.
Abstract: Test case prioritization techniques seek to maximize early fault detection. Fault localization seeks to use test cases already executed to help find the fault location. There is a natural interplay between the two techniques; once a fault is detected, we often switch focus to fault fixing, for which localization may be a first step. In this article we introduce the Fault Localization Prioritization (FLP) problem, which combines prioritization and localization. We evaluate three techniques: a novel FLP technique based on information theory, FLINT (Fault Localization using INformation Theory), that we introduce in this article, a standard Test Case Prioritization (TCP) technique, and a “test similarity technique” used in previous work. Our evaluation uses five different releases of four software systems. The results indicate that FLP and TCP can statistically significantly reduce fault localization costs for 73p and 76p of cases, respectively, and that FLINT significantly outperforms similarity-based localization techniques in 52p of the cases considered in the study.
103 citations
23 Sep 2014
TL;DR: Differential Fault Intensity Analysis is introduced, which combines the principles of Differential Power Analysis and fault injection and finds that with an average of 7 fault injections, it can reconstruct a full 128-bit AES key.
Abstract: Recent research has demonstrated that there is no sharp distinction between passive attacks based on side-channel leakage and active attacks based on fault injection. Fault behavior can be processed as side-channel information, offering all the benefits of Differential Power Analysis including noise averaging and hypothesis testing by correlation. This paper introduces Differential Fault Intensity Analysis, which combines the principles of Differential Power Analysis and fault injection. We observe that most faults are biased - such as single-bit, two-bit, or three-bit errors in a byte - and that this property can reveal the secret key through a hypothesis test. Unlike Differential Fault Analysis, we do not require precise analysis of the fault propagation. Unlike Fault Sensitivity Analysis, we do not require a fault sensitivity profile for the device under attack. We demonstrate our method on an FPGA implementation of AES with a fault injection model. We find that with an average of 7 fault injections, we can reconstruct a full 128-bit AES key.
103 citations
29 Aug 1989
TL;DR: The authors introduce WARP, a weighted test generation system that includes a canonical circuit for resolving weights to any desired precision and analyzes pattern coverage and benchmark results on fault coverage differences between CARs and LFSRs.
Abstract: The authors introduce WARP, a weighted test generation system that includes a canonical circuit for resolving weights to any desired precision. Either cellular automata registers (CARs) or linear feedback shift registers (LFSRs) are used as a source of random patterns, and optionally, it is possible to permute and linearly combine random bits from the source to control inputs to the weighting circuit. The authors analyze pattern coverage and conclude with benchmark results on fault coverage differences between CARs and LFSRs. >
103 citations
26 Oct 2004
TL;DR: This work proposes an effective method for applying fine-delay fault testing in order to improve defect coverage of especially resistive opens by grouping conventional delay-fault patterns into sets of almost equal-length paths, which narrows the overall path length distribution and allows running the pattern sets at a higher speed, thus enabling the detection of small delay faults.
Abstract: This work proposes an effective method for applying fine-delay fault testing in order to improve defect coverage of especially resistive opens. The method is based on grouping conventional delay-fault patterns into sets of almost equal-length paths. This narrows the overall path length distribution and allows running the pattern sets at a higher speed, thus enabling the detection of small delay faults. These small delay faults are otherwise undetectable because they are masked by longer paths. A requirement for this method is to have hazard-free paths. To obtain these (almost) hazard-free paths we use a fast and simple postprocessing step that filters out paths with hazards. The experimental data shows the effectiveness and the necessity of this filtering process.
102 citations