Topic
Fault coverage
About: Fault coverage is a research topic. Over the lifetime, 10153 publications have been published within this topic receiving 161933 citations. The topic is also known as: test coverage.
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26 May 1993
TL;DR: Key themes are the individual robustness properties of fault detection, fault isolation and controllers used as elements in a fault-tolerant system.
Abstract: Provides a perspective on the state of the art in robust approaches to fault-tolerant control and gives some indication of ways in which the research may best proceed. Key themes are the individual robustness properties of fault detection, fault isolation and controllers used as elements in a fault-tolerant system. Comparisons between active and passive approaches are made and emphasis is placed on the overall robustness properties of the fault-tolerant control system.<
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79 citations
TL;DR: In this paper, an accurate and efficient method is proposed for fault section estimation and fault distance calculation in distribution systems, based on frequency spectrum components of fault generated traveling waves, which can be divided into two parts.
79 citations
26 Apr 1998
TL;DR: It is shown that statistical encoding of test sets can be combined with low-cost pattern decoding for deterministic BIST and provides higher fault coverage than pseudorandom testing with shorter test application time.
Abstract: We present a new approach to built-in self-test of sequential circuits using precomputed test sets. Our approach is especially suited to circuits containing a large number of flip-flops but few primary inputs. Such circuits are often encountered as embedded cores and filters for digital signal processing, and are inherently difficult to test. We show that statistical encoding of test sets can be combined with low-cost pattern decoding for deterministic BIST. This approach exploits recent advances in sequential circuit ATPG and unlike other BIST schemes, does not require access to gate-level models of the circuit under test. Experimental results show that the proposed method provides higher fault coverage than pseudorandom testing with shorter test application time.
78 citations
TL;DR: A simple test generation technique is described which derives sinusoidal test waveforms that detect several fault classes and shows that certain stimuli will provoke variations in delay, rise time, and overshoot that indicate faulty behavior.
Abstract: This paper describes a simple test generation technique which derives sinusoidal test waveforms that detect several fault classes In addition, the authors show that certain stimuli will provoke variations in delay, rise time, and overshoot that indicate faulty behavior Simple algorithms compute the different parameters
78 citations
TL;DR: On testing 28,800 fault cases with varying fault resistance, fault inception angle, fault distance, load angle, percentage compensation level and source impedance, the performance of the proposedWT-ELM technique is found to be quite promising and the results indicate that the proposed method is robust to wide variation in system and operating conditions.
78 citations