Flip-flop

About: Flip-flop is a research topic. Over the lifetime, 2543 publications have been published within this topic receiving 20692 citations.

A non-volatile flip-flop in magnetic FPGA chip

Abstract: In this paper, the authors propose a non-volatile flip-flop, which presents simultaneously low power dissipation and high speed. This flip-flop is based on MRAM (magnetic RAM) technology on standard CMOS. In this non-volatile flip-flop design, the authors use magnetic tunnel junctions (MTJ) as storage element. Contrary to the complex sense amplifier circuit in standard MRAM circuits, a simple one based on SRAM cell is used to couple with two MTJs per bit in magnetic logic circuit. The flip-flop works exactly as a classical flip-flop hut the information is stored simultaneously in the two MTJs, which makes this flip-flop non-volatile. As the writing frequency has a strong impact on the power consumption, the MTJ writing frequency is designed to be defined by the users depending on different usage. During the startup or reset phase, the flip-flop master stage is used as the MTJ sense amplifier and the flip-flop is initialized to the previously stored state in about 200 ps. This figure has been demonstrated by electrical simulation on a 90 nm CMOS technology and with a complete and precise MTJ model

Edge-triggered staticized dynamic flip-flop with scan circuitry

Abstract: A flip-flop circuit with scan circuitry for use with static logic gates includes a dynamic input stage and a static output stage. The dynamic input stage is coupled to receive a data signal, a scan input signal, a scan enable signal, a data enable signal and a single-phase clock signal. During the precharge phase, the dynamic input stage provides an output signal that is the complement of the data or the scan signal. The dynamic input stage output signal is precharged to a logic high level during the precharge phase. During the precharge phase, the static output stage maintains the flip-flop output signal logic at the logic level of the previous evaluation phase independently of the signal received from the dynamic input stage. During the evaluation phase in the normal mode, the dynamic input stage generates an output signal that either remains at a logic high level or else transitions from high-to-low, complementing the logic level of the data signal. During the evaluation phase in the scan mode, the dynamic input stage outputs the complement of the scan input signal that either remains at a logic high level or else transitions from high-to-low, complementing the logic level of the scan input signal. The static output stage receives the output signal from the dynamic input stage and the clock signal. During the evaluation phase, the static output stage outputs the complement of the output signal received from the dynamic input stage.

Multifunction flip-flop-type circuit

Abstract: A flip-flop-type circuit capable of operating either as a conventional D flip-flop or as a device which merely passes through the data applied to it (so-called "flow-through mode"). In the flow-through mode, the circuit has the additional capability of being able to latch in the data flowing through it at any time. Thus the circuit can also operate as a level-sensitive latch.

Flip-flop circuit, scan path and storage circuit

Abstract: In order to obtain a flip-flop circuit which reduces an S/H time or a T-Q delay while suppressing power consumption, a master latch is formed by a dynamic half latch having a transmission gate (S1) and an invertor (INV1), while a slave latch is formed by a static half latch having transmission gates (S3, S4) and invertors (INV3, INV4). In the slave latch, the operation of the transmission gate (S4) is controlled not only by a clock signal (T) but by a mode signal (MODE). When the mode signal (MODE) is converted to a low level, the transmission gate (S4) enters a nonconducting state, so that the slave latch performs a dynamic operation.