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Focused ion beam

About: Focused ion beam is a research topic. Over the lifetime, 12154 publications have been published within this topic receiving 179523 citations. The topic is also known as: FIB.


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Journal ArticleDOI
TL;DR: By using a dry etch chemistry which relies on the highly preferential etching of silicon, over that of gallium (Ga), this work shows resist-free fabrication of precision, high aspect ratio nanostructures and microstructures in silicon using a focused ion beam and an inductively coupled plasma reactive ion etcher (ICP-RIE).
Abstract: By using a dry etch chemistry which relies on the highly preferential etching of silicon, over that of gallium (Ga), we show resist-free fabrication of precision, high aspect ratio nanostructures and microstructures in silicon using a focused ion beam (FIB) and an inductively coupled plasma reactive ion etcher (ICP-RIE). Silicon etch masks are patterned via Ga^+ ion implantation in a FIB and then anisotropically etched in an ICP-RIE using fluorinated etch chemistries. We determine the critical areal density of the implanted Ga layer in silicon required to achieve a desired etch depth for both a Pseudo Bosch (SF_6/C_4F_8) and cryogenic fluorine (SF_6/O_2) silicon etching. High fidelity nanoscale structures down to 30 nm and high aspect ratio structures of 17:1 are demonstrated. Since etch masks may be patterned on uneven surfaces, we utilize this lithography to create multilayer structures in silicon. The linear selectivity versus implanted Ga density enables grayscale lithography. Limits on the ultimate resolution and selectivity of Ga lithography are also discussed.

68 citations

Journal ArticleDOI
TL;DR: In this article, the results of recent work on the ion beam sputtering of Nb x Ge y under ultrahigh vacuum conditions using in situ diagnostics and on the dual beam deposition of Si 3 N 4 and diamond-like carbon are presented.

68 citations

Journal ArticleDOI
TL;DR: In this article, a 3D pattern-generating system for free-designed 3D structures using focused ion-beam chemical-vapor deposition is presented. But the 3D structure is fabricated by scanning 30 keV Ga+ ion-beam-assisted deposition in a 1×10−4 Pa phenanthrene atmosphere.
Abstract: We studied the fabrication of free-designed three-dimensional (3D) structures by using focused-ion-beam chemical-vapor deposition. The 3D structures are fabricated by scanning 30 keV Ga+ ion-beam-assisted deposition in a 1×10−4 Pa phenanthrene atmosphere. The scanning pattern and blanking signal of the ion beam are generated by a 3D computer-aided-designed model using a computer pattern-generating system. This 3D pattern-generating system is able to fabricate overhang and hollow structures by setting suitable parameters (for example, plot pitch, dwell time, time interval of irradiations, and priorities of scanning). In this article, we demonstrate the performance of a 3D pattern-generating system by fabricating a 1:100 000 000 scale model of the Enterprise spaceship, a microring, a moth’s eyelike structure, and a morpho butterflylike structure with 200 nm spacing.

68 citations

Journal ArticleDOI
TL;DR: In this article, the role of oxygen on microstructure and transport properties of the nanocomposite was investigated using a focused ion beam (FIB) and transmission electron microscopy (TEM).
Abstract: Phosphorus-doped silicon nanopowder from a gas phase process was compacted by DC-current sintering in order to obtain thermoelectrically active, nanocrystalline bulk silicon. A density between 95% and 96% compared to the density of single crystalline silicon was achieved, while preserving the nanocrystalline character with an average crystallite size of best 25 nm. As a native surface oxidation of the nanopowder usually occurs during nanopowder handling, a focus of this work is on the role of oxygen on microstructure and transport properties of the nanocomposite. A characterization with transmission electron microscopy (TEM) showed that the original core/shell structure of the nanoparticles was not found within the sintered nanocomposites. Two different types of oxide precipitates could be identified by energy filtered imaging technique. For a detailed analysis, 3-dimensional tomography with reconstruction was done using a needle-shaped sample prepared by focused ion beam (FIB). The 3-dimensional distribu...

67 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202394
2022278
2021251
2020329
2019351
2018347