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Focused ion beam

About: Focused ion beam is a research topic. Over the lifetime, 12154 publications have been published within this topic receiving 179523 citations. The topic is also known as: FIB.


Papers
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Journal ArticleDOI
01 Dec 2002-Polymer
TL;DR: In this paper, the use of the focused ion beam (FIB) technique for cross-sectional transmission electron microscopy (TEM) specimen preparation of polymer solar cells deposited on glass substrates is described.

52 citations

Journal ArticleDOI
TL;DR: In this article, the effect of the gallium-milled notch on mode I toughness quantification was investigated and it was found that notching using a focused gallium source can lead to an overestimation of the fracture toughness values for chromium nitride (CrN) thin films.
Abstract: For the implementation of thin ceramic hard coatings into intensive application environments, the fracture toughness is a particularly important material design parameter. Characterisation of the fracture toughness of small-scale specimens has been a topic of great debate, due to size effects, plasticity, residual stress effects and the influence of ion penetration from the sample fabrication process. In this work, several different small-scale fracture toughness geometries (single-beam cantilever, double-beam cantilever and micro-pillar splitting) were compared, fabricated from a thin physical vapour-deposited ceramic film using a focused ion beam source, and then the effect of the gallium-milled notch on mode I toughness quantification investigated. It was found that notching using a focused gallium source influences small-scale toughness measurements and can lead to an overestimation of the fracture toughness values for chromium nitride (CrN) thin films. The effects of gallium ion irradiation w...

52 citations

Journal ArticleDOI
TL;DR: In this paper, micro-compression samples from single crystalline and ultrafine-grained aluminum are fabricated using both xenon and/or gallium ions, and the effect of the gallium ion on the deformation morphology and resulting microstructures are observed.

52 citations

Journal ArticleDOI
TL;DR: In this article, a multi-modal correlative microscopy combining focused ion beam and scanning electron microscopy (FIB-SEM) with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) was used to map Li, Mn and Co nanoscale distributions.

52 citations

Journal ArticleDOI
TL;DR: In this paper, the significance of the stress values obtained for the same coating by X-ray diffraction and focused ion beam milling, and demonstrate that the analysis of residual stress depth gradients is possible by using FIB-DIC techniques.

52 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202394
2022278
2021251
2020329
2019351
2018347