Topic
Focused ion beam
About: Focused ion beam is a research topic. Over the lifetime, 12154 publications have been published within this topic receiving 179523 citations. The topic is also known as: FIB.
Papers published on a yearly basis
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TL;DR: In this paper, the use of the focused ion beam (FIB) technique for cross-sectional transmission electron microscopy (TEM) specimen preparation of polymer solar cells deposited on glass substrates is described.
52 citations
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TL;DR: In this article, the effect of the gallium-milled notch on mode I toughness quantification was investigated and it was found that notching using a focused gallium source can lead to an overestimation of the fracture toughness values for chromium nitride (CrN) thin films.
Abstract: For the implementation of thin ceramic hard coatings into intensive application environments, the fracture toughness is a particularly important material design parameter. Characterisation of the fracture toughness of small-scale specimens has been a topic of great debate, due to size effects, plasticity, residual stress effects and the influence of ion penetration from the sample fabrication process. In this work, several different small-scale fracture toughness geometries (single-beam cantilever, double-beam cantilever and micro-pillar splitting) were compared, fabricated from a thin physical vapour-deposited ceramic film using a focused ion beam source, and then the effect of the gallium-milled notch on mode I toughness quantification investigated. It was found that notching using a focused gallium source influences small-scale toughness measurements and can lead to an overestimation of the fracture toughness values for chromium nitride (CrN) thin films. The effects of gallium ion irradiation w...
52 citations
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TL;DR: In this paper, micro-compression samples from single crystalline and ultrafine-grained aluminum are fabricated using both xenon and/or gallium ions, and the effect of the gallium ion on the deformation morphology and resulting microstructures are observed.
52 citations
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TL;DR: In this article, a multi-modal correlative microscopy combining focused ion beam and scanning electron microscopy (FIB-SEM) with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) was used to map Li, Mn and Co nanoscale distributions.
52 citations
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TL;DR: In this paper, the significance of the stress values obtained for the same coating by X-ray diffraction and focused ion beam milling, and demonstrate that the analysis of residual stress depth gradients is possible by using FIB-DIC techniques.
52 citations