Topic
Focused ion beam
About: Focused ion beam is a research topic. Over the lifetime, 12154 publications have been published within this topic receiving 179523 citations. The topic is also known as: FIB.
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TL;DR: In this paper, a static write-read tester was used to read bit patterns on arrays of square islands cut with a focused ion beam into granular perpendicular magnetic recording media.
Abstract: We have written and read bit patterns on arrays of square islands cut with a focused ion beam into granular perpendicular magnetic recording media. Using a static write–read tester, we have written square-wave bit patterns on arrays of islands with sizes between 60 and 230 nm, matching the recording linear density to the pattern period. These measurements reveal the onset of single-domain behavior for islands smaller than 130 nm, in agreement with magnetic force microscope images. The recording performance of patterned regions is systematically compared to that of unpatterned regions.
126 citations
TL;DR: In this article, a dual-beam focused ion beam-scanning electron microscope was used to obtain three-dimensional microstructure of mixed ionic and electronic conducting cathode, La 0.6 Sr 0.4 Co 0.2 Fe 0.8 O 3− δ (LSCF6428), and its overpotential was predicted by the lattice Boltzmann method.
126 citations
TL;DR: This study comprehensively reveals the microstructure of Berea sandstone, which is often treated as a porous material with interconnected micro-pores of 2-5 μm, and shows that it has small interconnected pores and large crater-like voids throughout the bulk material.
125 citations
TL;DR: In this article, focused ion beam-scanning electron microscopy (FIB-SEM) and nano-scale X-ray computed tomography (nano-CT) have emerged as two popular nanotomography techniques for quantifying the 3D microstructure of porous materials.
124 citations
TL;DR: A finely focused ion beam is scanned over a surface on which a local gas ambient of dimethyl gold hexafluoro acetylacetonate is created by a directed miniature nozzle.
Abstract: A finely focused ion beam is scanned over a surface on which a local gas ambient of dimethyl gold hexafluoro acetylacetonate is created by a directed miniature nozzle. The incident ions induce the selective deposition of gold along the path traced by the beam. The 15‐keV Ga+ ion beam current is 100 pA and the beam diameter is 0.5 μm. Gold lines of 0.5 μm width and Gaussian profile are written. The film growth rate corresponds to five atoms deposited per incident ion. The focused ion beam deposited films contained 15% Ga, but less than 5% of other impurities, such as O or C. Deposition was also observed with broad ion beams of 750 eV Ar+ and 50 keV Si+. The resistivity of the films varied from 2×10−5 to 1.3×10−3 Ω cm.
123 citations