Topic
Fourier transform spectroscopy
About: Fourier transform spectroscopy is a research topic. Over the lifetime, 5418 publications have been published within this topic receiving 134133 citations.
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59 citations
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TL;DR: In this article, a high-resolution Fourier transform spectroscopy of the A 1 ε+u→X 1 ǫ+g electronic system was used to measure the dispersion energy and the exchange energy.
Abstract: Titanium sapphire laser induced fluorescence spectra of the A 1Σ+u→X 1Σ+g electronic system have been recorded at high resolution by Fourier transform spectroscopy. Ground state vibrational levels are observed up to v=81 corresponding to an internuclear distance of 15.4 A and to 99.96% of the potential well depth. A long range study of the potential energy curves (RKR and IPA) allowed the determination of the coefficients of the dispersion energy (multipolar expansion representation) and of the exchange energy (exponential representation). The dissociation energy is found to be 4450.75±0.15 cm−1.
59 citations
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59 citations
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TL;DR: In this paper, the catalytic activity of magnetic PANI/Au composite shells on the oxidation of dopamine was investigated by cyclic voltammetry and compared with Pd/C catalyst which was already widely used in industrial production.
59 citations
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TL;DR: In this paper, two new sampling and analysis techniques for assessing the condition of EPDM (ethylene-propylene diene monomer) composite insulators are presented, which are named the oxidation index and the chalking index.
Abstract: Two new sampling and analysis techniques for assessing the condition of EPDM (ethylene-propylene diene monomer) composite insulators are presented. Polymer oxidation is assessed by removing small amounts of surface polymer by swabbing with xylene and analyzing this material by FTIR (Fourier transform infrared) emission spectroscopy. A measure of the amount of surface chalking is obtained by scraping a small amount of degraded surface material with a blade and analyzing by FTIR absorption spectroscopy. Numerical indices quantifying the amount of oxidation and surface chalking are obtained by calculating the ratios of absorption or emission peak heights in the infrared spectra. These indices are named the oxidation index and the chalking index. Three types of field-aged 275 kV EPDM composite insulators are investigated and the results from the new techniques compared with analyzes by XPS (X-ray photoelectron spectroscopy) with good agreement. It is found that for two types of insulator that the oxidation index is increased in regions near the HV conductor.
59 citations