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Gate driver

About: Gate driver is a research topic. Over the lifetime, 7532 publications have been published within this topic receiving 75854 citations.


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Journal ArticleDOI
01 Jun 2009
TL;DR: This work designed, prototyped, and evaluated LCD integrated with a gate driver and a source driver using amorphous In‐Ga‐Zn‐Oxide TFTs having bottom‐gate bottom‐contact structure, thereby obtaining T FTs with superior characteristics.
Abstract: We designed, prototyped, and evaluated LCD integrated with a gate driver and a source driver using amorphous In-Ga-Zn-Oxide TFTs having bottom-gate bottom-contact structure, thereby obtaining TFTs with superior characteristics Then, we prototyped the world's first 4-inch QVGA LCD and integrated the gate driver and source driver on the display panel

984 citations

Journal ArticleDOI
TL;DR: In this paper, the authors describe computer simulations of various SOI MOSFETs with double and triple-gate structures, as well as gate-all-around devices.
Abstract: This paper describes computer simulations of various SOI MOSFETs with double and triple-gate structures, as well as gate-all-around devices. The concept of a triple-gate device with sidewalls extending into the buried oxide (hereby called a "/spl Pi/-gate" or "Pi-gate" MOSFET) is introduced. The Pi-gate device is simple to manufacture and offers electrical characteristics similar to the much harder to fabricate gate-all-around MOSFET. To explore the optimum design space for four different gate structures, simulations were performed with four variable device parameters: gate length, channel width, doping concentration, and silicon film thickness. The efficiency of the different gate structures is shown to be dependent of these parameters. The simulation results indicate that the the Pi-gate device is a very promising candidate for future nanometer MOSFET applications.

477 citations

Journal ArticleDOI
TL;DR: In this article, a new topology of cascaded multilevel inverter using a reduced number of switches, insulated gate driver circuits and voltage standing on switches is proposed, which results in reduction of installation area and cost and has simplicity of control system.

475 citations

Journal ArticleDOI
TL;DR: A new topology for cascaded multilevel converter based on submultileVEL converter units and full-bridge converters is proposed, optimized for various objectives, such as the minimization of the number of switches, gate driver circuits and capacitors, and blocking voltage on switches.
Abstract: In this paper, a new topology for cascaded multilevel converter based on submultilevel converter units and full-bridge converters is proposed. The proposed topology significantly reduces the number of dc voltage sources, switches, IGBTs, and power diodes as the number of output voltage levels increases. Also, an algorithm to determine dc voltage sources magnitudes is proposed. To synthesize maximum levels at the output voltage, the proposed topology is optimized for various objectives, such as the minimization of the number of switches, gate driver circuits and capacitors, and blocking voltage on switches. The analytical analyses of the power losses of the proposed converter are also presented. The operation and performance of the proposed multilevel converter have been evaluated with the experimental results of a single-phase 125-level prototype converter.

471 citations

Journal ArticleDOI
TL;DR: An overview of the major failure mechanisms of IGBT modules and their handling methods in power converter systems improving reliability is presented in this article, where fault-tolerant strategies for improving the reliability of power electronic systems under field operation are explained and compared in terms of performance and cost.
Abstract: Power electronics plays an important role in a wide range of applications in order to achieve high efficiency and performance. Increasing efforts are being made to improve the reliability of power electronics systems to ensure compliance with more stringent constraints on cost, safety, and availability in different applications. This paper presents an overview of the major failure mechanisms of IGBT modules and their handling methods in power converter systems improving reliability. The major failure mechanisms of IGBT modules are presented first, and methods for predicting lifetime and estimating the junction temperature of IGBT modules are then discussed. Subsequently, different methods for detecting open- and short-circuit faults are presented. Finally, fault-tolerant strategies for improving the reliability of power electronic systems under field operation are explained and compared in terms of performance and cost.

466 citations


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Performance
Metrics
No. of papers in the topic in previous years
YearPapers
202351
202297
2021235
2020372
2019425
2018449