Topic
Insulator (electricity)
About: Insulator (electricity) is a research topic. Over the lifetime, 15941 publications have been published within this topic receiving 108950 citations. The topic is also known as: electrical insulator.
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03 Mar 2003TL;DR: In this paper, an apparatus and method for reducing the incidence of electric field stress on portions of insulating structures within high voltage devices is described, which is suitable for utilization in x-ray tube devices.
Abstract: An apparatus and method for reducing the incidence of electric field stress on portions of insulating structures within high voltage devices is disclosed. Each of the embodiments disclosed herein modifies the conductive properties of the insulating structure surface in a non-uniform manner such that the distribution of voltage potential along the surface thereof is more fully equalized during operation of the high voltage device. This, in turn, reduces the per unit stress on the insulating structure caused by the electric field of the high voltage device. Through embodiments of the present invention are preferably directed to utilization in x-ray tube devices, a variety of high voltage devices may benefit from application of the disclosed matter.
32 citations
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TL;DR: Nishimori et al. as discussed by the authors demonstrated the generation of a 500-keV electron beam from a high dc voltage photoemission gun for an energy recovery linac light source.
Abstract: We demonstrated the generation of a 500-keV electron beam from a high dc voltage photoemission gun for an energy recovery linac light source [N. Nishimori et al., Appl. Phys. Lett. 102, 234103 (2013)]. This demonstration was achieved by addressing two discharge problems that lead to vacuum breakdown in the dc gun. One is field emission generated from a central stem electrode. We employed a segmented insulator to protect the ceramic insulator surface from the field emission. The other is microdischarge at an anode electrode or a vacuum chamber, which is triggered by microparticle transfer or field emission from a cathode electrode. An experimental investigation revealed that a larger acceleration gap, optimized mainly to reduce the surface electric field of the anode electrode, suppresses the microdischarge events that accompany gas desorption. It was also found that nonevaporable getter pumps placed around the acceleration gap greatly help to suppress those microdischarge events. The applied voltage as a function of the total gas desorption is shown to be a good measure for finding the optimum dc gun configuration.
32 citations
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TL;DR: In this paper, the frequency distribution of leakage current was used to monitor insulator performance in salt-fog environments, and the results showed that high frequency components are more effective than low-frequency components.
Abstract: This paper presents an analysis result of using the frequency distribution of leakage current to monitor insulator performance in salt-fog environments. Experiments have been carried out on silicone rubber insulator by injecting salt fog into an artificial fog chamber with an ultrasonic vibration salt-fog generator and applying an AC voltage of 30 kVrms at 50 Hz as the test voltage. Based on the frequency distribution extracted by a wavelet transform technique, the measured leakage current is separated into the low-, intermediate-, and high-frequency components. Cumulative charge at each frequency component is obtained by a time-integral method and found to correlate the frequency components and the insulator performance. Obtained results show that high-frequency components are more effective than low-frequency components on monitoring insulator performance in salt-fog environments.
32 citations
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TL;DR: In this article, the authors used a scanning force microscope in the "force versus distance mode" to detect the charge densities on the surfaces of insulators immersed in electrolyte solutions.
31 citations
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IBM1
TL;DR: In this paper, a graded oxide MIM or MIS structure employs band gap grading of the insulator oxide so that holes or electrons can be injected into the oxide under moderate electric field conditions from the contact at one interface.
Abstract: A graded oxide MIM or MIS structure employs band gap grading of the insulator oxide so that holes or electrons (depending on voltage bias) can be injected into the insulator oxide under moderate electric field conditions from the contact at one interface. Electron or hole injection from the opposite interface is blocked due to the larger insulator band gap near this interface. A graded oxide metal-silicon dioxide-silicon (MGOS) semiconductor structure may be fabricated by forming several pyrolytic or CVD SiO2 layers over a relatively thick thermal SiO2 layer, with the pyrolytic SiO2 layers having sequentially increasing excess Si content. This structure may also be fabricated by controlled Si ion implantation in the thermal SiO2 layer.
31 citations