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Lead zirconate titanate
About: Lead zirconate titanate is a research topic. Over the lifetime, 7141 publications have been published within this topic receiving 150878 citations.
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TL;DR: Ferroelectric lead zirconate titanate (PZT) thin films are deposited at a low substrate temperature (530-590 °C) by an electron cyclotron resonance (ECR) sputtering method using two targets: a ceramic PZT and a lead metal target Si wafers are employed as substrates as mentioned in this paper.
Abstract: Ferroelectric lead zirconate titanate (PZT) thin films are deposited at a low substrate temperature (530–590 °C) by an electron cyclotron resonance (ECR) sputtering method using two targets: a ceramic PZT and a lead metal target Si wafers are employed as substrates The piezoelectric constant e31 is 21 C m−2 without poling treatment for a PZT film deposited at 550 °C
42 citations
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TL;DR: In this paper, the authors considered the case of low reversal voltage and showed that the domain radius grows logarithmically with the voltage and the time of the domain formation.
Abstract: Kinetics of domain formation in ferroelectric films subjected to electric field of atomic force microscope (AFM) is considered for a case of low reversal voltage. Dependence of equilibrium domain sizes on AFM and film parameters is defined. It is shown that formation of domains is possible if the applied voltage exceeds some threshold value. Above this threshold lateral sizes of the domains increase proportionally to the voltage. Dynamic equations of the domain wall motion during the domain formation in films are constructed and solved. For films having high activation fields the domain radius grows logarithmically with time. The time of the domain formation is defined. The calculated results are in agreement with experiments on lead zirconate titanate, lithium tantalate, and lithium niobate films. Kinetics of the domain growth in films with low activation fields is predicted.
42 citations
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TL;DR: In this article, the pore walls of porous templates of polymeric precursors are wetted with silicon templates and the ferro-and piezoelectric properties of an individual PZT or BaTiO3 nanotube are characterized by measuring the local piezo-lectric hysteresis, and a sharp switching at the coercive voltage of about 2 V was shown from the hysterisis loop.
Abstract: Wetting of the pore walls of porous templates is a simple and convenient method to prepare nanotubes. Ferroelectric lead zirconate titanate and barium titanate nanotubes were fabricated by wetting of porous silicon templates of polymeric precursors. The ferro- and piezoelectric properties of an individual ferroelectric either of a PZT or a BaTiO3 nanotube were electrically characterized by measuring the local piezoelectric hysteresis. A sharp switching at the coercive voltage of about 2 V was shown from the hysterisis loop. The corresponding effective remnant piezoelectric coefficient is about 90 pm/V. We also expect that free-standing ferroelectric nanotubes obtained by partial etching of the silicon template will be used as building blocks of miniaturized devices and can have a significant impact in the field of nano-electromechanical systems.
42 citations
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TL;DR: Lead zirconate titanate thin films were annealed at various annealing temperatures from 400 to 700 °C for 30 min and X-ray diffraction showed that the pyrochlore phase was transformed to the perovskite phase at 450 °C and the film was fully crystallized.
Abstract: Lead zirconate titanate (Pb1.1(Zr0.52Ti0.48)O3) thin films of thickness 260 nm on Pt/Ti/SiO2/Si substrates were densified by 2.45 GHz microwave annealing. The PZT thin films were annealed at various annealing temperatures from 400 to 700 °C for 30 min. X-ray diffraction showed that the pyrochlore phase was transformed to the perovskite phase at 450 °C and the film was fully crystallized. The secondary (again pyrochlore) phase was observed in the PZT thin films, which were annealed above 550 °C. The surface morphologies were changed above 550 °C of the PZT thin films due to the secondary phase. Higher dielectric constant (er) and lower dielectric loss coercive field (Ec) were achieved for the 450 °C film than for the other annealed films.
42 citations
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TL;DR: In this paper, the dependences of piezoelectric properties of composites on poling conditions, particle size and contents of Lead Zirconate Titanate (PZT) were discussed especially.
Abstract: The sulphoaluminate cement was, for the first time, used to fabricate 0-3 piezoelectric composites by compressing technique. The dependences of piezoelectric properties of composites on poling conditions, particle size and contents of Lead Zirconate Titanate (PZT) were discussed especially. The results show that the piezoelectric properties of composites are improved by increasing poling field E, poling time t and poling temperature t. The optimum E, t and T are 4.0 kV/mm, 45 min and 120°C respectively in this work. The piezoelectric strain factor d33 is found to increase with increasing particle size of PZT. When the particle size of PZT is larger than about 130 μm, the d33 is nearly independent of particle size. The d33, g33 and the electromechanical coupling coefficient Kp, Kt of composites increase rapidly with increasing content of PZT. When the content of PZT reaches 85%, Kp and Kt are 28.54 and 28.19%, respectively.
42 citations